Inventor
KAWANISHI SHINSUKE
JP22 patents
⚠️ This page may combine multiple inventors who share the name “KAWANISHI SHINSUKE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI HIGH TECH CORP
20 patentsUSD748706SFeb 2, 2016
Thin membrane holder for an electron microscope
HITACHI HIGH TECH CORP6 citations83
USD730962SJun 2, 2015
Base of a thin membrane holder for an electron microscope
HITACHI HIGH TECH CORP6 citations83
US9472375B2Oct 18, 2016
Charged particle beam device, sample stage unit, and sample observation method
HITACHI HIGH TECH CORP3 citations72
USD731570SJun 9, 2015
Thin membrane holder for an electron microscope
HITACHI HIGH TECH CORP2 citations57
US10157724B2Dec 18, 2018
Electron scanning microscope and image generation method
HITACHI HIGH TECH CORP0 citations51
US9824854B2Nov 21, 2017
Charged particle beam device, image generation method, observation system
HITACHI HIGH TECH CORP0 citations51
US9741530B2Aug 22, 2017
Charged-particle-beam device, specimen-image acquisition method, and program recording medium
HITACHI HIGH TECH CORP1 citations51
US9633817B2Apr 25, 2017
Diaphragm mounting member and charged particle beam device
HITACHI HIGH TECH CORP1 citations51
US9236217B2Jan 12, 2016
Inspection or observation apparatus and sample inspection or observation method
HITACHI HIGH TECH CORP0 citations51
US9875877B2Jan 23, 2018
Electron scanning microscope and image generation method
HITACHI HIGH TECH CORP0 citations49
US9362083B2Jun 7, 2016
Charged particle beam apparatus and sample observation method
HITACHI HIGH TECH CORP0 citations46
US12374520B2Jul 29, 2025
Tweezers, conveyance device, and method for conveying sample piece
HITACHI HIGH TECH CORP0 citations45
US9741526B2Aug 22, 2017
Charged particle beam apparatus and sample image acquiring method
HITACHI HIGH TECH CORP0 citations41
US9564288B2Feb 7, 2017
Sample storage container, charged particle beam apparatus, and image acquiring method
HITACHI HIGH TECH CORP0 citations41
US9466457B2Oct 11, 2016
Observation apparatus and optical axis adjustment method
HITACHI HIGH TECH CORP0 citations41
US9373480B2Jun 21, 2016
Charged particle beam device and filter member
HITACHI HIGH TECH CORP0 citations41
US9263232B2Feb 16, 2016
Charged particle beam device
HITACHI HIGH TECH CORP0 citations41
US9251996B2Feb 2, 2016
Charged particle beam device, position adjusting method for diaphragm, and diaphragm position adjusting jig
HITACHI HIGH TECH CORP0 citations41
US9240305B2Jan 19, 2016
Charged particle beam device and sample observation method
HITACHI HIGH TECH CORP0 citations41
US10141157B2Nov 27, 2018
Method for adjusting height of sample and observation system
HITACHI HIGH TECH CORP0 citations40