Inventor
KIM YOUNG HEE
KR82 patents
⚠️ This page may combine multiple inventors who share the name “KIM YOUNG HEE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
21 patentsUS7432567B2Oct 7, 2008
Metal gate CMOS with at least a single gate metal and dual gate dielectrics
IBM58 citations98
US7598545B2Oct 6, 2009
Using metal/metal nitride bilayers as gate electrodes in self-aligned aggressively scaled CMOS devices
IBM20 citations93
US7902620B2Mar 8, 2011
Suspended germanium photodetector for silicon waveguide
IBM24 citations92
US7696036B2Apr 13, 2010
CMOS transistors with differential oxygen content high-k dielectrics
IBM33 citations92
US9391171B2Jul 12, 2016
Fin field effect transistor including a strained epitaxial semiconductor shell
IBM5 citations84
US9034748B2May 19, 2015
Process variability tolerant hard mask for replacement metal gate finFET devices
IBM13 citations84
US8861728B2Oct 14, 2014
Integrated circuit tamper detection and response
IBM12 citations84
US8383483B2Feb 26, 2013
High performance CMOS circuits, and methods for fabricating same
IBM10 citations84
US8035173B2Oct 11, 2011
CMOS transistors with differential oxygen content high-K dielectrics
IBM14 citations84
US7999323B2Aug 16, 2011
Using metal/metal nitride bilayers as gate electrodes in self-aligned aggressively scaled CMOS devices
IBM7 citations84
US7709902B2May 4, 2010
Metal gate CMOS with at least a single gate metal and dual gate dielectrics
IBM11 citations84
US7666732B2Feb 23, 2010
Method of fabricating a metal gate CMOS with at least a single gate metal and dual gate dielectrics
IBM11 citations84
US7749847B2Jul 6, 2010
CMOS integration scheme employing a silicide electrode and a silicide-germanide alloy electrode
IBM7 citations74
US9711416B2Jul 18, 2017
Fin field effect transistor including a strained epitaxial semiconductor shell
IBM2 citations73
US9397161B1Jul 19, 2016
Reduced current leakage semiconductor device
IBM3 citations73
US9679775B2Jun 13, 2017
Selective dopant junction for a group III-V semiconductor device
IBM2 citations72
US9418846B1Aug 16, 2016
Selective dopant junction for a group III-V semiconductor device
IBM4 citations72
US9627482B2Apr 18, 2017
Reduced current leakage semiconductor device
IBM1 citations63
US9054192B1Jun 9, 2015
Integration of Ge-containing fins and compound semiconductor fins
IBM2 citations63
US8912032B2Dec 16, 2014
Temperature control device for optoelectronic devices
IBM2 citations63
US7833849B2Nov 16, 2010
Method of fabricating a semiconductor structure including one device region having a metal gate electrode located atop a thinned polygate electrode
IBM4 citations63
HYUNDAI ELECTRONICS IND
9 patentsUS6396322B1May 28, 2002
Delay locked loop of a DDR SDRAM
HYUNDAI ELECTRONICS IND92 citations98
US6255895B1Jul 3, 2001
Circuit for generating a reference voltage trimmed by an anti-fuse programming
HYUNDAI ELECTRONICS IND22 citations93
US6184720B1Feb 6, 2001
Internal voltage generating circuit of a semiconductor device using test pad and a method thereof
HYUNDAI ELECTRONICS IND30 citations93
US6150868ANov 21, 2000
Anti-fuse programming circuit
HYUNDAI ELECTRONICS IND41 citations93
US6144247ANov 7, 2000
Anti-fuse programming circuit using variable voltage generator
HYUNDAI ELECTRONICS IND20 citations93
US6108261AAug 22, 2000
Repair circuit for redundancy circuit with anti-fuse
HYUNDAI ELECTRONICS IND30 citations93
US6169694B1Jan 2, 2001
Circuit and method for fully on-chip wafer level burn-in test
HYUNDAI ELECTRONICS IND20 citations89
US6133778AOct 17, 2000
Anti-fuse programming circuit with cross-coupled feedback loop
HYUNDAI ELECTRONICS IND19 citations84
US6356501B2Mar 12, 2002
Apparatus for generating high voltage signal
HYUNDAI ELECTRONICS IND15 citations81
SAMSUNG ELECTRONICS CO LTD
9 patentsUSRE38537EJun 22, 2004
Self-diagnosis arrangement for a video display and method of implementing the same
SAMSUNG ELECTRONICS CO LTD16 citations93
US5963249AOct 5, 1999
Self-diagnostic circuit for a video display and method of implementing the same
SAMSUNG ELECTRONICS CO LTD32 citations93
US5670972ASep 23, 1997
Self-diagnosis arrangement for a video display and method of implementing the same
SAMSUNG ELECTRONICS CO LTD33 citations93
US6660479B2Dec 9, 2003
Process for preparing peptide nucleic acid probe using polymeric photoacid generator
SAMSUNG ELECTRONICS CO LTD24 citations92
US6359125B1Mar 19, 2002
Process for preparing peptide nucleic acid probe using polymeric photoacid generator
SAMSUNG ELECTRONICS CO LTD36 citations92
US7196774B2Mar 27, 2007
Lithography device
SAMSUNG ELECTRONICS CO LTD10 citations82
US6649471B2Nov 18, 2003
Method of planarizing non-volatile memory device
SAMSUNG ELECTRONICS CO LTD20 citations82
US5686800ANov 11, 1997
Image-correction circuit and method for picture tube
SAMSUNG ELECTRONICS CO LTD9 citations74
US7131217B2Nov 7, 2006
Apparatus and method for drying semiconductor wafers using IPA vapor drying method
SAMSUNG ELECTRONICS CO LTD10 citations71
UNIV CALIFORNIA
1 patentHYNIX SEMICONDUCTOR INC
1 patentASSEFA SOLOMON
1 patentKIM YOUNG-HEE
1 patentMETA BIOMED CO LTD
1 patentKOREA ELECTRONICS TELECOMM
1 patentANDO TAKASHI
1 patentELECTRONICS & TELECOMMUNICATIONS RES INST
1 patentNAT UNIV CHANGWON IND ACAD COOP CORPS
1 patentSAMSUNG HEAVY IND
1 patentLIU JUN
1 patentShowing the top 50 of 82 patents by PatentIndex Score.