Inventor
PAN YAN
US29 patents
⚠️ This page may combine multiple inventors who share the name “PAN YAN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
GEN ELECTRIC
14 patentsUS9667157B1May 30, 2017
System and method for operating a power converter
GEN ELECTRIC30 citations94
US10211747B2Feb 19, 2019
System and method for operating a DC to DC power converter
GEN ELECTRIC15 citations85
US10372569B2Aug 6, 2019
Methods and system for detecting false data injection attacks
GEN ELECTRIC9 citations83
US9639643B2May 2, 2017
Method and system for generating electric load models
GEN ELECTRIC3 citations73
US10191101B2Jan 29, 2019
System and method for detecting ground fault in a dc system
GEN ELECTRIC2 citations72
US10008856B2Jun 26, 2018
Power system for offshore applications
GEN ELECTRIC6 citations71
US9829880B2Nov 28, 2017
System and method for modelling load in an electrical power network
GEN ELECTRIC2 citations71
US8963558B2Feb 24, 2015
Current differential protection
GEN ELECTRIC2 citations63
US10436823B2Oct 8, 2019
Systems and methods for swing angle estimation in an electrical power system
GEN ELECTRIC0 citations52
US8942108B2Jan 27, 2015
Method and system for current differential protection
GEN ELECTRIC1 citations52
US10700523B2Jun 30, 2020
System and method for distribution load forecasting in a power grid
GEN ELECTRIC0 citations42
US10024920B2Jul 17, 2018
Systems and methods for swing angle estimation in an electrical power system
GEN ELECTRIC0 citations42
US9654102B2May 16, 2017
Hybrid direct-current circuit breaker
GEN ELECTRIC0 citations42
US10613492B2Apr 7, 2020
Method and system for providing flexible reserve power for power grid
GEN ELECTRIC0 citations39
PAN YAN
2 patentsUNIV ELECTRONIC SCI & TECH CHINA
2 patentsGLOBALFOUNDRIES INC
2 patentsUS10234500B2Mar 19, 2019
Systematic defects inspection method with combined eBeam inspection and net tracing classification
GLOBALFOUNDRIES INC0 citations47
US10191112B2Jan 29, 2019
Early development of a database of fail signatures for systematic defects in integrated circuit (IC) chips
GLOBALFOUNDRIES INC0 citations29