P

Inventor

GRUBE GARY W

US750 patents
⚠️ This page may combine multiple inventors who share the name “GRUBE GARY W”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

FORMFACTOR INC

37 patents
US6913468B2Jul 5, 2005

Methods of removably mounting electronic components to a circuit board, and sockets formed by the methods

FORMFACTOR INC154 citations99
US6836962B2Jan 4, 2005

Method and apparatus for shaping spring elements

FORMFACTOR INC148 citations99
US6835898B2Dec 28, 2004

Electrical contact structures formed by configuring a flexible wire to have a springable shape and overcoating the wire with at least one layer of a resilient conductive material, methods of mounting the contact structures to electronic components, and applications for employing the contact structures

FORMFACTOR INC174 citations99
US6817052B2Nov 16, 2004

Apparatuses and methods for cleaning test probes

FORMFACTOR INC150 citations99
US6811406B2Nov 2, 2004

Microelectronic spring with additional protruding member

FORMFACTOR INC270 citations99
US6807734B2Oct 26, 2004

Microelectronic contact structures, and methods of making same

FORMFACTOR INC115 citations99
US6791176B2Sep 14, 2004

Lithographic contact elements

FORMFACTOR INC105 citations99
US6778406B2Aug 17, 2004

Resilient contact structures for interconnecting electronic devices

FORMFACTOR INC247 citations99
US6729019B2May 4, 2004

Method of manufacturing a probe card

FORMFACTOR INC185 citations99
US6727579B1Apr 27, 2004

Electrical contact structures formed by configuring a flexible wire to have a springable shape and overcoating the wire with at least one layer of a resilient conductive material, methods of mounting the contact structures to electronic components, and applications for employing the contact structures

FORMFACTOR INC203 citations99
US6701612B2Mar 9, 2004

Method and apparatus for shaping spring elements

FORMFACTOR INC135 citations99
US6672875B1Jan 6, 2004

Spring interconnect structures

FORMFACTOR INC249 citations99
US6655023B1Dec 2, 2003

Method and apparatus for burning-in semiconductor devices in wafer form

FORMFACTOR INC116 citations99
US6624648B2Sep 23, 2003

Probe card assembly

FORMFACTOR INC176 citations99
US6616966B2Sep 9, 2003

Method of making lithographic contact springs

FORMFACTOR INC179 citations99
US6534856B1Mar 18, 2003

Sockets for “springed” semiconductor devices

FORMFACTOR INC138 citations99
US6520778B1Feb 18, 2003

Microelectronic contact structures, and methods of making same

FORMFACTOR INC328 citations99
US6509751B1Jan 21, 2003

Planarizer for a semiconductor contactor

FORMFACTOR INC314 citations99
US6491968B1Dec 10, 2002

Methods for making spring interconnect structures

FORMFACTOR INC178 citations99
US6483328B1Nov 19, 2002

Probe card for probing wafers with raised contact elements

FORMFACTOR INC149 citations99
US6482013B2Nov 19, 2002

Microelectronic spring contact element and electronic component having a plurality of spring contact elements

FORMFACTOR INC272 citations99
US6475822B2Nov 5, 2002

Method of making microelectronic contact structures

FORMFACTOR INC123 citations99
US6255126B1Jul 3, 2001

Lithographic contact elements

FORMFACTOR INC410 citations99
US6246247B1Jun 12, 2001

Probe card assembly and kit, and methods of using same

FORMFACTOR INC180 citations99
US6232149B1May 15, 2001

Sockets for “springed” semiconductor devices

FORMFACTOR INC98 citations99
US6110823AAug 29, 2000

Method of modifying the thickness of a plating on a member by creating a temperature gradient on the member, applications for employing such a method, and structures resulting from such a method

FORMFACTOR INC299 citations99
US6050829AApr 18, 2000

Making discrete power connections to a space transformer of a probe card assembly

FORMFACTOR INC252 citations99
US6032356AMar 7, 2000

Wafer-level test and burn-in, and semiconductor process

FORMFACTOR INC275 citations99
US6033935AMar 7, 2000

Sockets for "springed" semiconductor devices

FORMFACTOR INC174 citations99
US5998228ADec 7, 1999

Method of testing semiconductor

FORMFACTOR INC165 citations99
US5983493ANov 16, 1999

Method of temporarily, then permanently, connecting to a semiconductor device

FORMFACTOR INC150 citations99
US5974662ANov 2, 1999

Method of planarizing tips of probe elements of a probe card assembly

FORMFACTOR INC649 citations99
US5884398AMar 23, 1999

Mounting spring elements on semiconductor devices

FORMFACTOR INC166 citations99
US5878486AMar 9, 1999

Method of burning-in semiconductor devices

FORMFACTOR INC167 citations99
US5864946AFeb 2, 1999

Method of making contact tip structures

FORMFACTOR INC289 citations99
US5832601ANov 10, 1998

Method of making temporary connections between electronic components

FORMFACTOR INC264 citations99
US5829128ANov 3, 1998

Method of mounting resilient contact structures to semiconductor devices

FORMFACTOR INC362 citations99

MOTOROLA INC

7 patents

TESSERA INC

3 patents

(unassigned)

2 patents

GRUBE GARY W

1 patent

Showing the top 50 of 750 patents by PatentIndex Score.