P

Inventor

PAN SAMUEL C

TW76 patents
⚠️ This page may combine multiple inventors who share the name “PAN SAMUEL C”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TAIWAN SEMICONDUCTOR MFG CO LTD

44 patents
US9978868B2May 22, 2018

Negative capacitance field effect transistor with charged dielectric material

TAIWAN SEMICONDUCTOR MFG CO LTD35 citations93
US9490430B1Nov 8, 2016

Field effect transistors and methods of forming same

TAIWAN SEMICONDUCTOR MFG CO LTD16 citations92
US10269981B2Apr 23, 2019

Multi-channel field effect transistors using 2D-material

TAIWAN SEMICONDUCTOR MFG CO LTD5 citations84
US9553199B2Jan 24, 2017

FET device having a vertical channel in a 2D material layer

TAIWAN SEMICONDUCTOR MFG CO LTD17 citations84
US9559168B2Jan 31, 2017

Field effect transistors and methods of forming same

TAIWAN SEMICONDUCTOR MFG CO LTD7 citations83
US9496259B2Nov 15, 2016

FinFET semiconductor device having fins with stronger structural strength

TAIWAN SEMICONDUCTOR MFG CO LTD8 citations83
US10332985B2Jun 25, 2019

Semiconductor device and manufacturing method thereof

TAIWAN SEMICONDUCTOR MFG CO LTD10 citations82
US10832957B2Nov 10, 2020

Method for direct forming stressor, semiconductor device having stressor, and method for forming the same

TAIWAN SEMICONDUCTOR MFG CO LTD1 citations73
US10516050B2Dec 24, 2019

Method for forming stressor, semiconductor device having stressor, and method for forming the same

TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US9934969B2Apr 3, 2018

Charged-particle-beam patterning without resist

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US9859115B2Jan 2, 2018

Semiconductor devices comprising 2D-materials and methods of manufacture thereof

TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US11502174B2Nov 15, 2022

Method for reducing Schottky barrier height and semiconductor device with reduced Schottky barrier height

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations72
US10985019B2Apr 20, 2021

Method of forming a semiconductor device using layered etching and repairing of damaged portions

TAIWAN SEMICONDUCTOR MFG CO LTD1 citations72
US10797137B2Oct 6, 2020

Method for reducing Schottky barrier height and semiconductor device with reduced Schottky barrier height

TAIWAN SEMICONDUCTOR MFG CO LTD3 citations72
US10636652B2Apr 28, 2020

Method of forming a semiconductor device using layered etching and repairing of damaged portions

TAIWAN SEMICONDUCTOR MFG CO LTD1 citations72
US10269564B2Apr 23, 2019

Method of forming a semiconductor device using layered etching and repairing of damaged portions

TAIWAN SEMICONDUCTOR MFG CO LTD3 citations72
US10461254B2Oct 29, 2019

Methods of graphene growth and related structures

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations71
US9923142B2Mar 20, 2018

Methods of graphene growth and related structures

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations71
US11031510B2Jun 8, 2021

Impact ionization semiconductor device and manufacturing method thereof

TAIWAN SEMICONDUCTOR MFG CO LTD1 citations70
US10510903B2Dec 17, 2019

Impact ionization semiconductor device and manufacturing method thereof

TAIWAN SEMICONDUCTOR MFG CO LTD3 citations70
US9577078B1Feb 21, 2017

Structure and formation method of semiconductor device structure

TAIWAN SEMICONDUCTOR MFG CO LTD5 citations70
US9941380B2Apr 10, 2018

Graphene transistor and related methods

TAIWAN SEMICONDUCTOR MFG CO LTD6 citations68
US9412439B1Aug 9, 2016

Hybrid TFET-MOSFET circuit design

TAIWAN SEMICONDUCTOR MFG CO LTD4 citations68
US11817481B2Nov 14, 2023

Method for reducing Schottky barrier height and semiconductor device with reduced Schottky barrier height

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11538938B2Dec 27, 2022

Method for forming stressor, semiconductor device having stressor, and method for forming the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11211460B2Dec 28, 2021

2D crystal hetero-structures and manufacturing methods thereof

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11164972B2Nov 2, 2021

Method for forming stressor, semiconductor device having stressor, and method for forming the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US10978461B2Apr 13, 2021

Antifuse array and method of forming antifuse using anodic oxidation

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US10957602B2Mar 23, 2021

Method for direct forming stressor, semiconductor device having stressor, and method for forming the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11563009B2Jan 24, 2023

Semiconductor memory device

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US10957784B2Mar 23, 2021

Semiconductor device and manufacturing method thereof

TAIWAN SEMICONDUCTOR MFG CO LTD1 citations61
US12308371B2May 20, 2025

Semiconductor device and manufacturing method thereof

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations60
US11791410B2Oct 17, 2023

Semiconductor device and manufacturing method thereof

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations60
US11605674B2Mar 14, 2023

Metal-insulator-semiconductor-insulator-metal (MISIM) device, method of operation, and memory device including the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations60
US11063149B2Jul 13, 2021

Semiconductor device and manufacturing method thereof

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations60
US11024674B2Jun 1, 2021

Metal-insulator-semiconductor-insulator-metal (MISIM) device, method of operation, and memory device including the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations60
US11152473B2Oct 19, 2021

Device with doped phosphorene and method for doping phosphorene

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations58
US10879404B2Dec 29, 2020

Multi-channel field effect transistors using 2D-material

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US10615036B2Apr 7, 2020

Charged-particle-beam patterning without resist

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US10510611B2Dec 17, 2019

Method for direct forming stressor, semiconductor device having stressor, and method for forming the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US10504907B2Dec 10, 2019

Antifuse array and method of forming antifuse using anodic oxidation

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US10347538B2Jul 9, 2019

Method for direct forming stressor, semiconductor device having stressor, and method for forming the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US10157737B2Dec 18, 2018

Semiconductor devices comprising 2D-materials and methods of manufacture thereof

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US9953989B2Apr 24, 2018

Antifuse array and method of forming antifuse using anodic oxidation

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52

MACRONIX INT CO LTD

5 patents

PAN SAMUEL C

1 patent

Showing the top 50 of 76 patents by PatentIndex Score.