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Inventor
WANG LIU DI
CN
2 patents
Patents
2 patents
US10345375B2
Jul 9, 2019
Test method and test apparatus for testing a plurality of blocks in a circuit
IBM
2 citations
64
US9664741B2
May 30, 2017
Test method and test apparatus for testing a plurality of blocks in a circuit
IBM
0 citations
43