Inventor

JAARSMA NEAL C

US6 patents

⚠️ This page may combine multiple inventors who share the name “JAARSMA NEAL C”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

AGILENT TECHNOLOGIES INC

2 patents

US6587981B1Jul 1, 2003

Integrated circuit with scan test structure

AGILENT TECHNOLOGIES INC91 citations95

US6751768B2Jun 15, 2004

Hierarchical creation of vectors for quiescent current (IDDQ) tests for system-on-chip circuits

AGILENT TECHNOLOGIES INC10 citations70

JAARSMA NEAL C

2 patents

US8159241B1Apr 17, 2012

Method and apparatus for on-chip adjustment of chip characteristics

JAARSMA NEAL C4 citations56

US9766966B1Sep 19, 2017

Method and apparatus for on-chip adjustment of chip characteristics

JAARSMA NEAL C0 citations45

HEWLETT PACKARD CO

1 patent

US5130989AJul 14, 1992

Serial and parallel scan technique for improved testing of systolic arrays

HEWLETT PACKARD CO6 citations60

MARVELL WORLD TRADE LTD

1 patent

US9443733B2Sep 13, 2016

Method and apparatus for authenticating a semiconductor die

MARVELL WORLD TRADE LTD0 citations48