Inventor

KRUIT PIETER

NL92 patents

⚠️ This page may combine multiple inventors who share the name “KRUIT PIETER”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

KRUIT PIETER

MAPPER LITHOGRAPHY IP BV

Apparatus for generating a plurality of beamlets

Charged particle beamlet exposure system

Lithography system

Electron beam exposure system

Electron beam exposure system

Apparatus for generating a plurality of beamlets

Direct write lithography system

Lithography system and projection method

Lithography system, sensor and measuring method

Apparatus for generating a plurality of beamlets

Apparatus for generating a plurality of beamlets

Apparatus for generating a plurality of beamlets

Adjustment in a MAPPER system

Projection lens arrangement

Lithography system

Lithography system comprising a converter plate and means for protecting the converter plate

Lithography system, method of clamping and wafer table

System, method and apparatus for multi-beam lithography including a dispenser cathode for homogeneous electron emission

UNIV DELFT TECH

Lithography system

Multi electron beam inspection apparatus

Electron microscope

Signal separator for a multi-beam charged particle inspection apparatus

Apparatus and method for inspecting a surface of a sample

Apparatus and method for inspecting a sample using a plurality of charged particle beams

PHILIPS CORP

Particle-optical apparatus comprising an electron source with a needle and a membrane-like extraction electrode

Particle-optical apparatus comprising a detector for secondary electrons

Electron detection with energy discrimination

Charged particle beam apparatus

Particle-optical apparatus comprising a fixed diaphragm for the monochromator filter

Auger spectrometry

KRUIT PIETER

Multiple beam charged particle optical system

Multiple beam charged particle optical system

Multiple beam charged particle optical system

Multiple beam charged particle optical system

DELMIC B V

Method for inspecting a sample using an assembly comprising a scanning electron microscope and a light microscope

Integrated optical and charged particle inspection apparatus

Integrated optical and charged particle inspection apparatus

APPLIED MATERIALS ISRAEL LTD

Method for inspecting a specimen and charged particle multi-beam device

Method for inspecting a specimen and charged particle multi-beam device

TNO

Method of inspecting a specimen surface, apparatus and use of fluorescent material

Method and a device for furnishing an ion stream

(unassigned)

Lithographic apparatus, device manufacturing method, and device manufactured thereby

LUCENT TECHNOLOGIES INC

Illumination system for electron beam lithography tool

WIELAND MARCO JAN JACO

Projection lens arrangement

ZONNEVYLLE AERNOUT CHRISTIAAN

Charged particle multi-beam apparatus including a manipulator device for manipulation of one or more charged particle beams

FEI CO

Particle-optical apparatus equipped with a gas ion source

KNIPPELS GUIDO MARTINUS HENRICUS

Beam blanker for interrupting a beam of charged particles

ASML NETHERLANDS BV

Lithography system, sensor and measuring method

MAPPER LIGHOGRAPHY IP B V

Optical switching in lithography system

HITACHI HIGH TECH CORP

Aberration correcting device for an electron microscope and an electron microscope comprising such a device