Inventor
DEWANZ DOUGLAS MICHAEL
US3 patents
Patents
3 patentsUS6643804B1Nov 4, 2003
Stability test for silicon on insulator SRAM memory cells utilizing bitline precharge stress operations to stress memory cells under test
IBM37 citations91
US6404686B1Jun 11, 2002
High performance, low cell stress, low power, SOI CMOS latch-type sensing method and apparatus
IBM9 citations73
US6275427B1Aug 14, 2001
Stability test for silicon on insulator SRAM memory cells utilizing disturb operations to stress memory cells under test
IBM11 citations72