Inventor · disambiguated record

Yasushi Fukutomi

Also filed as: FUKUTOMI YASUSHI

2 granted patents·30 citations·filing 1992–2004

60Inventor score

Technology areasG01B Y10S

Files withNIKON CORP2

Top patents by PatentIndex Score

2 records

0163US5317153AScanning probe microscopeNIKON CORP·Filed 1992·Granted May 31, 1994·25 cites·15 claims
0249US6963408B2Method and apparatus for point diffraction interferometryNIKON CORP·Filed 2004·Granted Nov 8, 2005·5 cites·32 claims

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Yasushi Fukutomi — Patent Inventor | PatentIndex