Inventor
WANG WEI-CHOU
TW16 patents
⚠️ This page may combine multiple inventors who share the name “WANG WEI-CHOU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
REALTEK SEMICONDUCTOR CORP
5 patentsUS11546002B2Jan 3, 2023
Transmitter, receiver and transceiver
REALTEK SEMICONDUCTOR CORP0 citations57
US11146281B2Oct 12, 2021
Multi-stage switched capacitor circuit and operation method thereof
REALTEK SEMICONDUCTOR CORP0 citations51
US7948273B2May 24, 2011
Soft-start device
REALTEK SEMICONDUCTOR CORP1 citations51
US10659070B2May 19, 2020
Digital to analog converter device and current control method
REALTEK SEMICONDUCTOR CORP0 citations48
US11451237B2Sep 20, 2022
Sample and hold circuit and method
REALTEK SEMICONDUCTOR CORP0 citations47
WIN SEMICONDUCTORS CORP
4 patentsUS10084109B1Sep 25, 2018
Semiconductor structure for improving the gate adhesion and Schottky stability
WIN SEMICONDUCTORS CORP2 citations67
US10886392B2Jan 5, 2021
Semiconductor structure for improving thermal stability and Schottky behavior
WIN SEMICONDUCTORS CORP0 citations46
US12237382B2Feb 25, 2025
Semiconductor device and power amplifier
WIN SEMICONDUCTORS CORP0 citations44
US9136345B1Sep 15, 2015
Method to produce high electron mobility transistors with Boron implanted isolation
WIN SEMICONDUCTORS CORP1 citations44
CHANGXIN MEMORY TECH INC
3 patentsUS12094516B2Sep 17, 2024
Method and apparatus for intensifying current leakage between adjacent memory cells, and method and apparatus for current leakage detection
CHANGXIN MEMORY TECH INC0 citations59
US11705178B2Jul 18, 2023
Method and apparatus for determining refresh counter of dynamic random access memory (DRAM)
CHANGXIN MEMORY TECH INC0 citations51
US11852657B2Dec 26, 2023
Tester and method for calibrating probe card and device under testing (DUT)
CHANGXIN MEMORY TECH INC0 citations40