P

Inventor

KOBRINSKY MAURO J

US75 patents
⚠️ This page may combine multiple inventors who share the name “KOBRINSKY MAURO J”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

INTEL CORP

45 patents
US6790748B2Sep 14, 2004

Thinning techniques for wafer-to-wafer vertical stacks

INTEL CORP242 citations99
US8993404B2Mar 31, 2015

Metal-insulator-metal capacitor formation techniques

INTEL CORP92 citations97
US7307005B2Dec 11, 2007

Wafer bonding with highly compliant plate having filler material enclosed hollow core

INTEL CORP226 citations96
US10886217B2Jan 5, 2021

Integrated circuit device with back-side interconnection to deep source/drain semiconductor

INTEL CORP20 citations94
US10797139B2Oct 6, 2020

Methods of forming backside self-aligned vias and structures formed thereby

INTEL CORP22 citations94
US6870270B2Mar 22, 2005

Method and structure for interfacing electronic devices

INTEL CORP25 citations92
US11367796B2Jun 21, 2022

Gate-all-around integrated circuit structures having asymmetric source and drain contact structures

INTEL CORP6 citations86
US11335686B2May 17, 2022

Transistors with back-side contacts to create three dimensional memory and logic

INTEL CORP8 citations86
US11257822B2Feb 22, 2022

Three-dimensional nanoribbon-based dynamic random-access memory

INTEL CORP9 citations86
US11087832B1Aug 10, 2021

Three-dimensional nanoribbon-based static random-access memory

INTEL CORP18 citations86
US10734412B2Aug 4, 2020

Backside contact resistance reduction for semiconductor devices with metallization on both sides

INTEL CORP15 citations86
US11239238B2Feb 1, 2022

Thin film transistor based memory cells on both sides of a layer of logic devices

INTEL CORP13 citations85
US11056492B1Jul 6, 2021

Dense memory arrays utilizing access transistors with back-side contacts

INTEL CORP9 citations85
US11139241B2Oct 5, 2021

Integrated circuit device with crenellated metal trace layout

INTEL CORP6 citations84
US10367070B2Jul 30, 2019

Methods of forming backside self-aligned vias and structures formed thereby

INTEL CORP8 citations84
US10054737B2Aug 21, 2018

Optical I/O system using planar light-wave integrated circuit

INTEL CORP12 citations84
US7973407B2Jul 5, 2011

Three-dimensional stacked substrate arrangements

INTEL CORP12 citations83
US11799037B2Oct 24, 2023

Gate-all-around integrated circuit structures having asymmetric source and drain contact structures

INTEL CORP2 citations73
US11616015B2Mar 28, 2023

Integrated circuit device with back-side interconnection to deep source/drain semiconductor

INTEL CORP3 citations73
US11373999B2Jun 28, 2022

Deep trench via for three-dimensional integrated circuit

INTEL CORP3 citations73
US11139300B2Oct 5, 2021

Three-dimensional memory arrays with layer selector transistors

INTEL CORP5 citations73
US10892337B2Jan 12, 2021

Backside source/drain replacement for semiconductor devices with metallization on both sides

INTEL CORP2 citations73
US10553532B2Feb 4, 2020

Structure and method to self align via to top and bottom of tight pitch metal interconnect layers

INTEL CORP6 citations73
US10497613B2Dec 3, 2019

Microelectronic conductive routes and methods of making the same

INTEL CORP5 citations73
US12170273B2Dec 17, 2024

Integrated circuit assemblies with direct chip attach to circuit boards

INTEL CORP2 citations72
US9443922B2Sep 13, 2016

Metal-insulator-metal capacitor formation techniques

INTEL CORP4 citations72
US7105925B2Sep 12, 2006

Differential planarization

INTEL CORP6 citations72
US11062995B2Jul 13, 2021

Interconnect fabricated with flowable copper

INTEL CORP2 citations71
US11621354B2Apr 4, 2023

Integrated circuit structures having partitioned source or drain contact structures

INTEL CORP2 citations70
US11329162B2May 10, 2022

Integrated circuit structures having differentiated neighboring partitioned source or drain contact structures

INTEL CORP3 citations70
US11056356B1Jul 6, 2021

Fluid viscosity control during wafer bonding

INTEL CORP5 citations70
US10720345B1Jul 21, 2020

Wafer to wafer bonding with low wafer distortion

INTEL CORP3 citations69
US9343411B2May 17, 2016

Techniques for enhancing fracture resistance of interconnects

INTEL CORP3 citations68
US12327809B2Jun 10, 2025

Vertically stacked and bonded memory arrays

INTEL CORP1 citations64
US12230721B2Feb 18, 2025

Gate-all-around integrated circuit structures having asymmetric source and drain contact structures

INTEL CORP0 citations63
US12147083B2Nov 19, 2024

Hybrid manufacturing for integrating photonic and electronic components

INTEL CORP1 citations63
US7402509B2Jul 22, 2008

Method of forming self-passivating interconnects and resulting devices

INTEL CORP5 citations63
US12532538B2Jan 20, 2026

Integrated circuit structures having conductive structures in fin isolation regions

INTEL CORP0 citations62
US12519058B2Jan 6, 2026

Device layer interconnects

INTEL CORP0 citations62
US12419085B2Sep 16, 2025

Integrated circuit structures having backside gate tie-down

INTEL CORP0 citations62
US12278229B2Apr 15, 2025

Hybrid manufacturing for integrated circuit devices and assemblies

INTEL CORP0 citations62
US12114479B2Oct 8, 2024

Three-dimensional memory arrays with layer selector transistors

INTEL CORP0 citations62
US12100705B2Sep 24, 2024

Deep trench via for three-dimensional integrated circuit

INTEL CORP0 citations62
US12058849B2Aug 6, 2024

Three-dimensional nanoribbon-based dynamic random-access memory

INTEL CORP0 citations62
US11996362B2May 28, 2024

Integrated circuit device with crenellated metal trace layout

INTEL CORP0 citations62

KOBRINSKY MAURO J

3 patents

RAMANATHAN SHRIRAM

1 patent

TSENG JIA-HUNG

1 patent

Showing the top 50 of 75 patents by PatentIndex Score.