Inventor
INAGAKI KATSUHIKO
JP2 patents
Patents
2 patentsUS7553335B2Jun 30, 2009
Scanning probe microscope probe and manufacturing method therefor, scanning probe microscope and using method therefor, needle-like body and manufacturing method therefor, electronic device and manufacturing method therefor, charge density wave quantum phase microscope, and charge density wave quantum interferometer
JAPAN SCIENCE & TECH AGENCY5 citations51
US7374817B2May 20, 2008
Topological crystal of transition metal chalcogenide and method of forming the same
JAPAN SCIENCE & TECH AGENCY1 citations37