Inventor
SEKI YASUKAZU
JP23 patents
⚠️ This page may combine multiple inventors who share the name “SEKI YASUKAZU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
FUJI ELECTRIC CO LTD
16 patentsUS5789311AAug 4, 1998
Manufacturing method of SiC Schottky diode
FUJI ELECTRIC CO LTD84 citations96
US5032888AJul 16, 1991
Conductivity modulation buried gate trench type MOSFET
FUJI ELECTRIC CO LTD71 citations96
US5034336AJul 23, 1991
Method of producing insulated gate bipolar tranistor
FUJI ELECTRIC CO LTD28 citations92
US5025293AJun 18, 1991
Conductivity modulation type MOSFET
FUJI ELECTRIC CO LTD23 citations92
US4914047AApr 3, 1990
Method of producing insulated gate MOSFET employing polysilicon mask
FUJI ELECTRIC CO LTD26 citations92
US5532502AJul 2, 1996
Conductivity-modulated-type MOSFET
FUJI ELECTRIC CO LTD14 citations74
US5349212ASep 20, 1994
Semiconductor device having thyristor structure
FUJI ELECTRIC CO LTD19 citations74
US4901124AFeb 13, 1990
Conductivity modulated MOSFET
FUJI ELECTRIC CO LTD12 citations74
US9825145B2Nov 21, 2017
Method of manufacturing silicon carbide semiconductor device including forming an electric field control region by a laser doping technology
FUJI ELECTRIC CO LTD2 citations73
US4835587AMay 30, 1989
Semiconductor device for detecting radiation
FUJI ELECTRIC CO LTD8 citations73
US4762803AAug 9, 1988
Process for forming crystalline films by glow discharge
FUJI ELECTRIC CO LTD14 citations73
US4896200AJan 23, 1990
Novel semiconductor-based radiation detector
FUJI ELECTRIC CO LTD17 citations72
US4689649AAug 25, 1987
Semiconductor radiation detector
FUJI ELECTRIC CO LTD5 citations63
US5068581ANov 26, 1991
Horizontal deflection circuit for high-frequency scanning
FUJI ELECTRIC CO LTD5 citations62
US10109501B2Oct 23, 2018
Manufacturing method of semiconductor device having a voltage resistant structure
FUJI ELECTRIC CO LTD0 citations52
US9786749B2Oct 10, 2017
Semiconductor device having a voltage resistant structure
FUJI ELECTRIC CO LTD0 citations52
FUJI ELECTRIC RES
6 patentsUS4565588AJan 21, 1986
Method for diffusion of impurities
FUJI ELECTRIC RES85 citations96
US4692782ASep 8, 1987
Semiconductor radioactive ray detector
FUJI ELECTRIC RES27 citations91
US4671651AJun 9, 1987
Solid-state optical temperature measuring device
FUJI ELECTRIC RES23 citations80
US4618381AOct 21, 1986
Method for adding impurities to semiconductor base material
FUJI ELECTRIC RES24 citations78
US4627991ADec 9, 1986
Method for forming a protective film on a semiconductor body
FUJI ELECTRIC RES3 citations61
US4611224ASep 9, 1986
Semiconductor radiation detector
FUJI ELECTRIC RES5 citations61