P

Inventor

JEON JOONG S

US26 patents
⚠️ This page may combine multiple inventors who share the name “JEON JOONG S”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ADVANCED MICRO DEVICES INC

16 patents
US6645882B1Nov 11, 2003

Preparation of composite high-K/standard-K dielectrics for semiconductor devices

ADVANCED MICRO DEVICES INC122 citations99
US6586349B1Jul 1, 2003

Integrated process for fabrication of graded composite dielectric material layers for semiconductor devices

ADVANCED MICRO DEVICES INC220 citations99
US7071051B1Jul 4, 2006

Method for forming a thin, high quality buffer layer in a field effect transistor and related structure

ADVANCED MICRO DEVICES INC550 citations98
US6764898B1Jul 20, 2004

Implantation into high-K dielectric material after gate etch to facilitate removal

ADVANCED MICRO DEVICES INC76 citations98
US6451641B1Sep 17, 2002

Non-reducing process for deposition of polysilicon gate electrode over high-K gate dielectric material

ADVANCED MICRO DEVICES INC148 citations98
US6693004B1Feb 17, 2004

Interfacial barrier layer in semiconductor devices with high-K gate dielectric material

ADVANCED MICRO DEVICES INC33 citations93
US6849925B1Feb 1, 2005

Preparation of composite high-K/standard-K dielectrics for semiconductor devices

ADVANCED MICRO DEVICES INC22 citations92
US6797572B1Sep 28, 2004

Method for forming a field effect transistor having a high-k gate dielectric and related structure

ADVANCED MICRO DEVICES INC36 citations92
US7176531B1Feb 13, 2007

CMOS gates formed by integrating metals having different work functions and having a high-k gate dielectric

ADVANCED MICRO DEVICES INC22 citations91
US6872613B1Mar 29, 2005

Method for integrating metals having different work functions to form CMOS gates having a high-k gate dielectric and related structure

ADVANCED MICRO DEVICES INC28 citations91
US6905971B1Jun 14, 2005

Treatment of dielectric material to enhance etch rate

ADVANCED MICRO DEVICES INC9 citations74
US6902977B1Jun 7, 2005

Method for forming polysilicon gate on high-k dielectric and related structure

ADVANCED MICRO DEVICES INC10 citations74
US6991990B1Jan 31, 2006

Method for forming a field effect transistor having a high-k gate dielectric

ADVANCED MICRO DEVICES INC3 citations63
US6762454B1Jul 13, 2004

Stacked polysilicon layer for boron penetration inhibition

ADVANCED MICRO DEVICES INC4 citations63
US7026211B1Apr 11, 2006

Semiconductor component and method of manufacture

ADVANCED MICRO DEVICES INC4 citations62
US6992370B1Jan 31, 2006

Memory cell structure having nitride layer with reduced charge loss and method for fabricating same

ADVANCED MICRO DEVICES INC2 citations60

SAMSUNG ELECTRONICS CO LTD

6 patents

MOON CHANG-WOOK

2 patents

KIM JUN-YOUN

1 patent

PARK SUNG-HO

1 patent