Inventor
BAEK GWANG-HYEON
KR2 patents
Patents
2 patentsUS7802210B2Sep 21, 2010
Methods and systems for analyzing layouts of semiconductor integrated circuit devices
SAMSUNG ELECTRONICS CO LTD9 citations76
US7703055B2Apr 20, 2010
Method and system for enhancing yield of semiconductor integrated circuit devices using systematic fault rate of hole
SAMSUNG ELECTRONICS CO LTD0 citations34