P

Inventor

EN WILLIAM G

US52 patents
⚠️ This page may combine multiple inventors who share the name “EN WILLIAM G”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ADVANCED MICRO DEVICES INC

45 patents
US7402207B1Jul 22, 2008

Method and apparatus for controlling the thickness of a selective epitaxial growth layer

ADVANCED MICRO DEVICES INC104 citations98
US6764898B1Jul 20, 2004

Implantation into high-K dielectric material after gate etch to facilitate removal

ADVANCED MICRO DEVICES INC76 citations98
US6611023B1Aug 26, 2003

Field effect transistor with self alligned double gate and method of forming same

ADVANCED MICRO DEVICES INC83 citations98
US6548361B1Apr 15, 2003

SOI MOSFET and method of fabrication

ADVANCED MICRO DEVICES INC84 citations98
US6448114B1Sep 10, 2002

Method of fabricating a silicon-on-insulator (SOI) chip having an active layer of non-uniform thickness

ADVANCED MICRO DEVICES INC93 citations98
US6414355B1Jul 2, 2002

Silicon-on-insulator (SOI) chip having an active layer of non-uniform thickness

ADVANCED MICRO DEVICES INC79 citations98
US6410371B1Jun 25, 2002

Method of fabrication of semiconductor-on-insulator (SOI) wafer having a Si/SiGe/Si active layer

ADVANCED MICRO DEVICES INC163 citations98
US6563183B1May 13, 2003

Gate array with multiple dielectric properties and method for forming same

ADVANCED MICRO DEVICES INC113 citations96
US6451656B1Sep 17, 2002

CMOS inverter configured from double gate MOSFET and method of fabricating same

ADVANCED MICRO DEVICES INC68 citations96
US6512244B1Jan 28, 2003

SOI device with structure for enhancing carrier recombination and method of fabricating same

ADVANCED MICRO DEVICES INC60 citations95
US6713357B1Mar 30, 2004

Method to reduce parasitic capacitance of MOS transistors

ADVANCED MICRO DEVICES INC65 citations94
US7456062B1Nov 25, 2008

Method of forming a semiconductor device

ADVANCED MICRO DEVICES INC25 citations93
US6723666B1Apr 20, 2004

Method for reducing gate oxide surface irregularities

ADVANCED MICRO DEVICES INC20 citations93
US6713819B1Mar 30, 2004

SOI MOSFET having amorphized source drain and method of fabrication

ADVANCED MICRO DEVICES INC45 citations93
US6693004B1Feb 17, 2004

Interfacial barrier layer in semiconductor devices with high-K gate dielectric material

ADVANCED MICRO DEVICES INC33 citations93
US6518631B1Feb 11, 2003

Multi-Thickness silicide device formed by succesive spacers

ADVANCED MICRO DEVICES INC25 citations93
US6441433B1Aug 27, 2002

Method of making a multi-thickness silicide SOI device

ADVANCED MICRO DEVICES INC24 citations93
US6121663ASep 19, 2000

Local interconnects for improved alignment tolerance and size reduction

ADVANCED MICRO DEVICES INC16 citations93
US6060766AMay 9, 2000

Protection of hydrogen sensitive regions in semiconductor devices from the positive charge associated with plasma deposited barriers or layers

ADVANCED MICRO DEVICES INC50 citations93
US6867130B1Mar 15, 2005

Enhanced silicidation of polysilicon gate electrodes

ADVANCED MICRO DEVICES INC45 citations92
US6765227B1Jul 20, 2004

Semiconductor-on-insulator (SOI) wafer having a Si/SiGe/Si active layer and method of fabrication using wafer bonding

ADVANCED MICRO DEVICES INC43 citations92
US6764917B1Jul 20, 2004

SOI device with different silicon thicknesses

ADVANCED MICRO DEVICES INC23 citations92
US6114235ASep 5, 2000

Multipurpose cap layer dielectric

ADVANCED MICRO DEVICES INC32 citations92
US6066567AMay 23, 2000

Methods for in-situ removal of an anti-reflective coating during an oxide resistor protect etching process

ADVANCED MICRO DEVICES INC29 citations92
US6060328AMay 9, 2000

Methods and arrangements for determining an endpoint for an in-situ local interconnect etching process

ADVANCED MICRO DEVICES INC40 citations92
US5990524ANov 23, 1999

Silicon oxime spacer for preventing over-etching during local interconnect formation

ADVANCED MICRO DEVICES INC40 citations92
US7402485B1Jul 22, 2008

Method of forming a semiconductor device

ADVANCED MICRO DEVICES INC9 citations84
US6566213B2May 20, 2003

Method of fabricating multi-thickness silicide device formed by disposable spacers

ADVANCED MICRO DEVICES INC15 citations84
US7122863B1Oct 17, 2006

SOI device with structure for enhancing carrier recombination and method of fabricating same

ADVANCED MICRO DEVICES INC17 citations83
US6964875B1Nov 15, 2005

Array of gate dielectric structures to measure gate dielectric thickness and parasitic capacitance

ADVANCED MICRO DEVICES INC15 citations83
US6166428ADec 26, 2000

Formation of a barrier layer for tungsten damascene interconnects by nitrogen implantation of amorphous silicon or polysilicon

ADVANCED MICRO DEVICES INC16 citations79
US6905971B1Jun 14, 2005

Treatment of dielectric material to enhance etch rate

ADVANCED MICRO DEVICES INC9 citations74
US6492830B1Dec 10, 2002

Method and circuit for measuring charge dump of an individual transistor in an SOI device

ADVANCED MICRO DEVICES INC7 citations74
US6399480B1Jun 4, 2002

Methods and arrangements for insulating local interconnects for improved alignment tolerance and size reduction

ADVANCED MICRO DEVICES INC7 citations74
US6358362B1Mar 19, 2002

Methods and arrangements for determining an endpoint for an in-situ local interconnect etching process

ADVANCED MICRO DEVICES INC12 citations74
US6297167B1Oct 2, 2001

In-situ etch of multiple layers during formation of local interconnects

ADVANCED MICRO DEVICES INC8 citations74
US6103611AAug 15, 2000

Methods and arrangements for improved spacer formation within a semiconductor device

ADVANCED MICRO DEVICES INC13 citations74
US6048761AApr 11, 2000

Method for manufacturing a semiconductor device with self-aligned protection diode

ADVANCED MICRO DEVICES INC11 citations74
US5900664AMay 4, 1999

Semiconductor device with self-aligned protection diode

ADVANCED MICRO DEVICES INC14 citations74
US5895269AApr 20, 1999

Methods for preventing deleterious punch-through during local interconnect formation

ADVANCED MICRO DEVICES INC15 citations74
US6780776B1Aug 24, 2004

Nitride offset spacer to minimize silicon recess by using poly reoxidation layer as etch stop layer

ADVANCED MICRO DEVICES INC9 citations73
US6535015B1Mar 18, 2003

Device and method for testing performance of silicon structures

ADVANCED MICRO DEVICES INC11 citations73
US6087271AJul 11, 2000

Methods for removal of an anti-reflective coating following a resist protect etching process

ADVANCED MICRO DEVICES INC14 citations73
US6027959AFeb 22, 2000

Methods for in-situ removal of an anti-reflective coating during a nitride resistor protect etching process

ADVANCED MICRO DEVICES INC14 citations73
US6841832B1Jan 11, 2005

Array of gate dielectric structures to measure gate dielectric thickness and parasitic capacitance

ADVANCED MICRO DEVICES INC6 citations72

SILICON GENESIS CORP

5 patents

Showing the top 50 of 52 patents by PatentIndex Score.