Inventor
EN WILLIAM G
US52 patents
⚠️ This page may combine multiple inventors who share the name “EN WILLIAM G”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ADVANCED MICRO DEVICES INC
45 patentsUS7402207B1Jul 22, 2008
Method and apparatus for controlling the thickness of a selective epitaxial growth layer
ADVANCED MICRO DEVICES INC104 citations98
US6764898B1Jul 20, 2004
Implantation into high-K dielectric material after gate etch to facilitate removal
ADVANCED MICRO DEVICES INC76 citations98
US6611023B1Aug 26, 2003
Field effect transistor with self alligned double gate and method of forming same
ADVANCED MICRO DEVICES INC83 citations98
US6548361B1Apr 15, 2003
SOI MOSFET and method of fabrication
ADVANCED MICRO DEVICES INC84 citations98
US6448114B1Sep 10, 2002
Method of fabricating a silicon-on-insulator (SOI) chip having an active layer of non-uniform thickness
ADVANCED MICRO DEVICES INC93 citations98
US6414355B1Jul 2, 2002
Silicon-on-insulator (SOI) chip having an active layer of non-uniform thickness
ADVANCED MICRO DEVICES INC79 citations98
US6410371B1Jun 25, 2002
Method of fabrication of semiconductor-on-insulator (SOI) wafer having a Si/SiGe/Si active layer
ADVANCED MICRO DEVICES INC163 citations98
US6563183B1May 13, 2003
Gate array with multiple dielectric properties and method for forming same
ADVANCED MICRO DEVICES INC113 citations96
US6451656B1Sep 17, 2002
CMOS inverter configured from double gate MOSFET and method of fabricating same
ADVANCED MICRO DEVICES INC68 citations96
US6512244B1Jan 28, 2003
SOI device with structure for enhancing carrier recombination and method of fabricating same
ADVANCED MICRO DEVICES INC60 citations95
US6713357B1Mar 30, 2004
Method to reduce parasitic capacitance of MOS transistors
ADVANCED MICRO DEVICES INC65 citations94
US7456062B1Nov 25, 2008
Method of forming a semiconductor device
ADVANCED MICRO DEVICES INC25 citations93
US6723666B1Apr 20, 2004
Method for reducing gate oxide surface irregularities
ADVANCED MICRO DEVICES INC20 citations93
US6713819B1Mar 30, 2004
SOI MOSFET having amorphized source drain and method of fabrication
ADVANCED MICRO DEVICES INC45 citations93
US6693004B1Feb 17, 2004
Interfacial barrier layer in semiconductor devices with high-K gate dielectric material
ADVANCED MICRO DEVICES INC33 citations93
US6518631B1Feb 11, 2003
Multi-Thickness silicide device formed by succesive spacers
ADVANCED MICRO DEVICES INC25 citations93
US6441433B1Aug 27, 2002
Method of making a multi-thickness silicide SOI device
ADVANCED MICRO DEVICES INC24 citations93
US6121663ASep 19, 2000
Local interconnects for improved alignment tolerance and size reduction
ADVANCED MICRO DEVICES INC16 citations93
US6060766AMay 9, 2000
Protection of hydrogen sensitive regions in semiconductor devices from the positive charge associated with plasma deposited barriers or layers
ADVANCED MICRO DEVICES INC50 citations93
US6867130B1Mar 15, 2005
Enhanced silicidation of polysilicon gate electrodes
ADVANCED MICRO DEVICES INC45 citations92
US6765227B1Jul 20, 2004
Semiconductor-on-insulator (SOI) wafer having a Si/SiGe/Si active layer and method of fabrication using wafer bonding
ADVANCED MICRO DEVICES INC43 citations92
US6764917B1Jul 20, 2004
SOI device with different silicon thicknesses
ADVANCED MICRO DEVICES INC23 citations92
US6114235ASep 5, 2000
Multipurpose cap layer dielectric
ADVANCED MICRO DEVICES INC32 citations92
US6066567AMay 23, 2000
Methods for in-situ removal of an anti-reflective coating during an oxide resistor protect etching process
ADVANCED MICRO DEVICES INC29 citations92
US6060328AMay 9, 2000
Methods and arrangements for determining an endpoint for an in-situ local interconnect etching process
ADVANCED MICRO DEVICES INC40 citations92
US5990524ANov 23, 1999
Silicon oxime spacer for preventing over-etching during local interconnect formation
ADVANCED MICRO DEVICES INC40 citations92
US7402485B1Jul 22, 2008
Method of forming a semiconductor device
ADVANCED MICRO DEVICES INC9 citations84
US6566213B2May 20, 2003
Method of fabricating multi-thickness silicide device formed by disposable spacers
ADVANCED MICRO DEVICES INC15 citations84
US7122863B1Oct 17, 2006
SOI device with structure for enhancing carrier recombination and method of fabricating same
ADVANCED MICRO DEVICES INC17 citations83
US6964875B1Nov 15, 2005
Array of gate dielectric structures to measure gate dielectric thickness and parasitic capacitance
ADVANCED MICRO DEVICES INC15 citations83
US6166428ADec 26, 2000
Formation of a barrier layer for tungsten damascene interconnects by nitrogen implantation of amorphous silicon or polysilicon
ADVANCED MICRO DEVICES INC16 citations79
US6905971B1Jun 14, 2005
Treatment of dielectric material to enhance etch rate
ADVANCED MICRO DEVICES INC9 citations74
US6492830B1Dec 10, 2002
Method and circuit for measuring charge dump of an individual transistor in an SOI device
ADVANCED MICRO DEVICES INC7 citations74
US6399480B1Jun 4, 2002
Methods and arrangements for insulating local interconnects for improved alignment tolerance and size reduction
ADVANCED MICRO DEVICES INC7 citations74
US6358362B1Mar 19, 2002
Methods and arrangements for determining an endpoint for an in-situ local interconnect etching process
ADVANCED MICRO DEVICES INC12 citations74
US6297167B1Oct 2, 2001
In-situ etch of multiple layers during formation of local interconnects
ADVANCED MICRO DEVICES INC8 citations74
US6103611AAug 15, 2000
Methods and arrangements for improved spacer formation within a semiconductor device
ADVANCED MICRO DEVICES INC13 citations74
US6048761AApr 11, 2000
Method for manufacturing a semiconductor device with self-aligned protection diode
ADVANCED MICRO DEVICES INC11 citations74
US5900664AMay 4, 1999
Semiconductor device with self-aligned protection diode
ADVANCED MICRO DEVICES INC14 citations74
US5895269AApr 20, 1999
Methods for preventing deleterious punch-through during local interconnect formation
ADVANCED MICRO DEVICES INC15 citations74
US6780776B1Aug 24, 2004
Nitride offset spacer to minimize silicon recess by using poly reoxidation layer as etch stop layer
ADVANCED MICRO DEVICES INC9 citations73
US6535015B1Mar 18, 2003
Device and method for testing performance of silicon structures
ADVANCED MICRO DEVICES INC11 citations73
US6087271AJul 11, 2000
Methods for removal of an anti-reflective coating following a resist protect etching process
ADVANCED MICRO DEVICES INC14 citations73
US6027959AFeb 22, 2000
Methods for in-situ removal of an anti-reflective coating during a nitride resistor protect etching process
ADVANCED MICRO DEVICES INC14 citations73
US6841832B1Jan 11, 2005
Array of gate dielectric structures to measure gate dielectric thickness and parasitic capacitance
ADVANCED MICRO DEVICES INC6 citations72
SILICON GENESIS CORP
5 patentsUS7056808B2Jun 6, 2006
Cleaving process to fabricate multilayered substrates using low implantation doses
SILICON GENESIS CORP121 citations98
US6534381B2Mar 18, 2003
Method for fabricating multi-layered substrates
SILICON GENESIS CORP139 citations98
US6500732B1Dec 31, 2002
Cleaving process to fabricate multilayered substrates using low implantation doses
SILICON GENESIS CORP150 citations96
US6458723B1Oct 1, 2002
High temperature implant apparatus
SILICON GENESIS CORP39 citations93
US7378330B2May 27, 2008
Cleaving process to fabricate multilayered substrates using low implantation doses
SILICON GENESIS CORP9 citations84
Showing the top 50 of 52 patents by PatentIndex Score.