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Inventor

MARIS HUMPHREY J

US33 patents
⚠️ This page may combine multiple inventors who share the name “MARIS HUMPHREY J”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

UNIV BROWN RES FOUND

21 patents
US6211961B1Apr 3, 2001

Optical method for the characterization of the electrical properties of semiconductors and insulating films

UNIV BROWN RES FOUND103 citations98
US5959735ASep 28, 1999

Optical stress generator and detector

UNIV BROWN RES FOUND163 citations98
US5748318AMay 5, 1998

Optical stress generator and detector

UNIV BROWN RES FOUND321 citations98
US5706094AJan 6, 1998

Ultrafast optical technique for the characterization of altered materials

UNIV BROWN RES FOUND133 citations98
US6175416B1Jan 16, 2001

Optical stress generator and detector

UNIV BROWN RES FOUND83 citations97
US5844684ADec 1, 1998

Optical method for determining the mechanical properties of a material

UNIV BROWN RES FOUND107 citations97
US5748317AMay 5, 1998

Apparatus and method for characterizing thin film and interfaces using an optical heat generator and detector

UNIV BROWN RES FOUND137 citations97
US6400449B2Jun 4, 2002

Optical stress generator and detector

UNIV BROWN RES FOUND64 citations96
US6321601B1Nov 27, 2001

Optical method for the characterization of laterally-patterned samples in integrated circuits

UNIV BROWN RES FOUND71 citations96
US6271921B1Aug 7, 2001

Optical stress generator and detector

UNIV BROWN RES FOUND41 citations96
US6208418B1Mar 27, 2001

Apparatus and method for measurement of the mechanical properties and electromigration of thin films

UNIV BROWN RES FOUND60 citations96
US6208421B1Mar 27, 2001

Optical stress generator and detector

UNIV BROWN RES FOUND61 citations96
US6191855B1Feb 20, 2001

Apparatus and method for the determination of grain size in thin films

UNIV BROWN RES FOUND62 citations96
US6038026AMar 14, 2000

Apparatus and method for the determination of grain size in thin films

UNIV BROWN RES FOUND57 citations96
US6025918AFeb 15, 2000

Apparatus and method for measurement of the mechanical properties and electromigration of thin films

UNIV BROWN RES FOUND69 citations96
US5864393AJan 26, 1999

Optical method for the determination of stress in thin films

UNIV BROWN RES FOUND61 citations96
US6008906ADec 28, 1999

Optical method for the characterization of the electrical properties of semiconductors and insulating films

UNIV BROWN RES FOUND100 citations93
US6563591B2May 13, 2003

Optical method for the determination of grain orientation in films

UNIV BROWN RES FOUND18 citations92
US6381019B1Apr 30, 2002

Ultrasonic generator and detector using an optical mask having a grating for launching a plurality of spatially distributed, time varying strain pulses in a sample

UNIV BROWN RES FOUND24 citations92
US6317216B1Nov 13, 2001

Optical method for the determination of grain orientation in films

UNIV BROWN RES FOUND30 citations92
US6512586B2Jan 28, 2003

Ultrasonic generator and detector using an optical mask having a grating for launching a plurality of spatially distributed, time varying strain pulses in a sample

UNIV BROWN RES FOUND10 citations74

UNIV BROWN

6 patents

MARIS HUMPHREY J

4 patents

BW BROWN UNIVERSITY RESEARCH F

1 patent

COLGAN MICHAEL

1 patent