Inventor

THEWES ROLAND

DE75 patents

⚠️ This page may combine multiple inventors who share the name “THEWES ROLAND”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

THEWES ROLAND

SIEMENS AG

Multi-value read-only memory cell having an improved signal-to-noise ratio

Arrangement for inductive signal transmission between the chip layers of a vertically integrated circuit

Amplifier with neuron MOS transistors

DNA chip comprising a microarray made of an microelectrode system

Device for the jump-like addressing of specific lines of a serially operating digital memory

Matrix memory in virtual ground architecture

Matrix memory (virtual ground)

Arrangement for capacitive signal transmission between the chip layers of a vertically integrated circuit

Potentiostatic circuit arrangement on a biosensor for digitisation of the measured current

Circuit arrangement, electrochemical sensor, sensor arrangement, and method for processing a current signal provided via a sensor electrode

Circuit for comparing two electrical quantities provided by a first neuron MOS field effect transistor and a reference source

Steep edge time-delay relay

Circuit arrangement for realizing logic elements that can be represented by threshold value equations

Devices for the self-adjusting setting of the operating point in amplifier circuits with neuron MOS transistors

Method for programming a ROM cell arrangement

Digital/analog converter using a floating gate MOS neuron transistor with capacitive coupling

Read amplifier for semiconductor memory cells with means to compensate threshold voltage differences in read amplifier transistors

Biosensor and method for detecting macromolecular biopolymers using a biosensor

Micromechanical sensor element

Semiconductor neuron with variable input weights

Serially accessible memory means with high error correctability

Sensor arrangement and method for operating a sensor arrangement

Planar sensor arrangement, sensor array and method for the production of a planar-sensor arrangement

Associative memory and method for the operation thereof

Threshold logic circuit with low space requirement

INFINEON TECHNOLOGIES AG

Noise-reducing transistor arrangement

Sensor arrangement

Transistor arrangement, integrated circuit and method for operating field effect transistors

Measuring cell and measuring field comprising measuring cells of this type, use of a measuring and use of a measuring field

Biosensor circuit and sensor array consisting of a plurality of said biosensor circuits and biosensor array

Integrated memory having memory cells with magnetoresistive storage effect

Sensor array and method for detecting the condition of a transistor in a sensor array

Test circuit arrangement and method for testing a multiplicity of transistors

Circuit configuration and method for reducing the 1/f noise of MOSFETs

Electronic circuit, sensor arrangement and method for processing a sensor signal

Polyvalent, magnetoresistive write/read memory and method for writing and reading a memory of this type

Circuit configuration for evaluating the information content of a memory cell

Device for evaluating cell resistances in a magnetoresistive memory

Magnetoresistive memory having elevated interference immunity

Circuit configuration fir evaluating the information content of a memory cell

Image acquisition apparatus

Magnetoresistive memory with a low current density

Device for evaluating cell resistances in a magnetoresistive memory

Magnetoresistive memory and method for reading a magnetoresistive memory

Sensor arrangement and method for operating a sensor arrangement

Magnetoresistive memory and method for reading a magnetoresistive memory

FERRANT RICHARD

Differential sense amplifier without switch transistors

Differential sense amplifier without dedicated pass-gate transistors

QIMONDA AG

Method and apparatus for reducing charge trapping in high-k dielectric material

BREDERLOW RALF

Measuring arrangement, semiconductor arrangement and method for operating a semiconductor component as a reference source