Inventor
YUE YONGHAI
CN3 patents
Patents
3 patentsUS8569714B2Oct 29, 2013
Double tilt transmission electron microscope sample holder for in-situ measurement of microstructures
HAN XIAODONG13 citations81
US8302494B2Nov 6, 2012
Sensor for quantitative measurement of electromechanical properties and microstructure of nano-materials and method for making the same
HAN XIAODONG4 citations60
US8069733B2Dec 6, 2011
Device and method for measuring electromechanical properties and microstructure of nano-materials under stress state
HAN XIAODONG5 citations59