Inventor
ZHANG YUEFEI
CN2 patents
Patents
2 patentsUS8569714B2Oct 29, 2013
Double tilt transmission electron microscope sample holder for in-situ measurement of microstructures
HAN XIAODONG13 citations81
US8069733B2Dec 6, 2011
Device and method for measuring electromechanical properties and microstructure of nano-materials under stress state
HAN XIAODONG5 citations59