Inventor · disambiguated record

Bernd K. F. Koenermann

Also filed as: KOENERMANN BERND K F

1 granted patent·6 citations·filing 2006–2006

29Inventor score

Technology areasH10P

Files withIBM1

Top patents by PatentIndex Score

1 record

0177US7381986B2Arrangement for testing semiconductor chips while incorporated on a semiconductor waferIBM·Filed 2006·Granted Jun 3, 2008·6 cites·8 claims

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