Inventor
KANG SUNGHO
KR45 patents
⚠️ This page may combine multiple inventors who share the name “KANG SUNGHO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
10 patentsUS9947290B2Apr 17, 2018
Multi embedded timing controller, display panel, and computer system having the same
SAMSUNG ELECTRONICS CO LTD3 citations65
US8854614B2Oct 7, 2014
Methods of thermally treating a semiconductor wafer
SAMSUNG ELECTRONICS CO LTD4 citations65
US11430137B2Aug 30, 2022
Electronic device and control method therefor
SAMSUNG ELECTRONICS CO LTD0 citations59
US10043799B2Aug 7, 2018
Method of manufacturing semiconductor device using surface treatment and semiconductor device manufactured by the method
SAMSUNG ELECTRONICS CO LTD1 citations52
US9576840B2Feb 21, 2017
Method of manufacturing semiconductor device using surface treatment and semiconductor device manufactured by the method
SAMSUNG ELECTRONICS CO LTD0 citations52
US12175361B2Dec 24, 2024
Electronic device, image processing method of electronic device, and computer-readable medium
SAMSUNG ELECTRONICS CO LTD0 citations49
US12001954B2Jun 4, 2024
Method of performing learning of deep neural network and apparatus thereof
SAMSUNG ELECTRONICS CO LTD0 citations49
US11755904B2Sep 12, 2023
Method and device for controlling data input and output of fully connected network
SAMSUNG ELECTRONICS CO LTD0 citations49
US12283529B2Apr 22, 2025
Method of repairing through-electrodes, repair device performing the same and semiconductor device including the same
SAMSUNG ELECTRONICS CO LTD0 citations45
US11531277B2Dec 20, 2022
Extreme ultraviolet (EUV) mask inspection system, a load-lock chamber included therein, and a method for inspecting an EUV mask using the EUV mask inspection system
SAMSUNG ELECTRONICS CO LTD0 citations38
UNIV YONSEI IACF
8 patentsUS10001525B2Jun 19, 2018
Semiconductor device and method for testing the same
UNIV YONSEI IACF7 citations84
US11387196B2Jul 12, 2022
On-chip security circuit for detecting and protecting against invasive attacks
UNIV YONSEI IACF6 citations75
US10403555B2Sep 3, 2019
Three dimensional integrated circuit having redundant through silicon via base on rotatable cube
UNIV YONSEI IACF2 citations73
US10170398B2Jan 1, 2019
Three-dimensional integrated circuit
UNIV YONSEI IACF3 citations64
US11386973B2Jul 12, 2022
Method and apparatus for built in redundancy analysis with dynamic fault reconfiguration
UNIV YONSEI IACF0 citations62
US11315657B2Apr 26, 2022
Stacked memory apparatus using error correction code and repairing method thereof
UNIV YONSEI IACF0 citations51
US9230051B2Jan 5, 2016
Method of generating voltage island for 3D many-core chip multiprocessor
UNIV YONSEI IACF1 citations48
US10395755B2Aug 27, 2019
Stacked memory device using base die spare cell and method of repairing the same
UNIV YONSEI IACF0 citations40
HALLA CLIMATE CONTROL CORP
4 patentsUS7937954B2May 10, 2011
Cooling and heating cabinet device of rear seat for vehicles using thermoelectric element
HALLA CLIMATE CONTROL CORP17 citations79
US7540322B2Jun 2, 2009
Air conditioner for vehicle
HALLA CLIMATE CONTROL CORP7 citations71
US7055591B2Jun 6, 2006
Air conditioner for vehicle
HALLA CLIMATE CONTROL CORP9 citations71
US7607316B2Oct 27, 2009
Air conditioner for vehicle
HALLA CLIMATE CONTROL CORP4 citations59
MOTOROLA INC
3 patentsUS5600787AFeb 4, 1997
Method and data processing system for verifying circuit test vectors
MOTOROLA INC42 citations90
US5583787ADec 10, 1996
Method and data processing system for determining electrical circuit path delays
MOTOROLA INC31 citations90
US5517506AMay 14, 1996
Method and data processing system for testing circuits using boolean differences
MOTOROLA INC13 citations71
UNIV NORTHEASTERN
3 patentsUS10643810B2May 5, 2020
Zero power plasmonic microelectromechanical device
UNIV NORTHEASTERN7 citations82
US11557449B2Jan 17, 2023
Zero power plasmonic microelectromechanical device
UNIV NORTHEASTERN2 citations71
US12169145B2Dec 17, 2024
Zero power micromechanical switch-based sensing and monitoring system
UNIV NORTHEASTERN0 citations50
UIF UNIV INDUSTRY FOUNDATION YONSEI UNIV
3 patentsUS11567132B2Jan 31, 2023
Scan apparatus capable of fault diagnosis and scan chain fault diagnosis method
UIF UNIV INDUSTRY FOUNDATION YONSEI UNIV3 citations68
US12000891B2Jun 4, 2024
Scan correlation-aware scan cluster reordering method and apparatus for low-power testing
UIF UNIV INDUSTRY FOUNDATION YONSEI UNIV0 citations62
US12405303B2Sep 2, 2025
Scan chain security circuit and driving method thereof
UIF UNIV INDUSTRY FOUNDATION YONSEI UNIV0 citations57