Inventor
WUU SHOU-GWO
TW105 patents
⚠️ This page may combine multiple inventors who share the name “WUU SHOU-GWO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG
47 patentsUS6165880ADec 26, 2000
Double spacer technology for making self-aligned contacts (SAC) on semiconductor integrated circuits
TAIWAN SEMICONDUCTOR MFG186 citations99
US6642076B1Nov 4, 2003
Asymmetrical reset transistor with double-diffused source for CMOS image sensor
TAIWAN SEMICONDUCTOR MFG78 citations98
US6194258B1Feb 27, 2001
Method of forming an image sensor cell and a CMOS logic circuit device
TAIWAN SEMICONDUCTOR MFG111 citations98
US6117722ASep 12, 2000
SRAM layout for relaxing mechanical stress in shallow trench isolation technology and method of manufacture thereof
TAIWAN SEMICONDUCTOR MFG243 citations98
US6815787B1Nov 9, 2004
Grid metal design for large density CMOS image sensor
TAIWAN SEMICONDUCTOR MFG61 citations96
US6518085B1Feb 11, 2003
Method for making spectrally efficient photodiode structures for CMOS color imagers
TAIWAN SEMICONDUCTOR MFG58 citations96
US6372603B1Apr 16, 2002
Photodiode with tightly-controlled junction profile for CMOS image sensor with STI process
TAIWAN SEMICONDUCTOR MFG60 citations96
US6265271B1Jul 24, 2001
Integration of the borderless contact salicide process
TAIWAN SEMICONDUCTOR MFG58 citations96
US5677557AOct 14, 1997
Method for forming buried plug contacts on semiconductor integrated circuits
TAIWAN SEMICONDUCTOR MFG61 citations96
US5480814AJan 2, 1996
Process of making a polysilicon barrier layer in a self-aligned contact module
TAIWAN SEMICONDUCTOR MFG70 citations95
US7935994B2May 3, 2011
Light shield for CMOS imager
TAIWAN SEMICONDUCTOR MFG17 citations93
US7588993B2Sep 15, 2009
Alignment for backside illumination sensor
TAIWAN SEMICONDUCTOR MFG31 citations93
US7232697B2Jun 19, 2007
Semiconductor device having enhanced photo sensitivity and method for manufacture thereof
TAIWAN SEMICONDUCTOR MFG16 citations93
US6710413B2Mar 23, 2004
Salicide field effect transistors with improved borderless contact structures and a method of fabrication
TAIWAN SEMICONDUCTOR MFG30 citations93
US6351016B1Feb 26, 2002
Technology for high performance buried contact and tungsten polycide gate integration
TAIWAN SEMICONDUCTOR MFG19 citations93
US6335249B1Jan 1, 2002
Salicide field effect transistors with improved borderless contact structures and a method of fabrication
TAIWAN SEMICONDUCTOR MFG44 citations93
US8053856B1Nov 8, 2011
Backside illuminated sensor processing
TAIWAN SEMICONDUCTOR MFG26 citations92
US7791170B2Sep 7, 2010
Method of making a deep junction for electrical crosstalk reduction of an image sensor
TAIWAN SEMICONDUCTOR MFG37 citations92
US7507596B2Mar 24, 2009
Method of fabricating a high quantum efficiency photodiode
TAIWAN SEMICONDUCTOR MFG40 citations92
US7388187B1Jun 17, 2008
Cross-talk reduction through deep pixel well implant for image sensors
TAIWAN SEMICONDUCTOR MFG29 citations92
US6350662B1Feb 26, 2002
Method to reduce defects in shallow trench isolations by post liner anneal
TAIWAN SEMICONDUCTOR MFG45 citations92
US5796150AAug 18, 1998
High-performance and reliable thin film transistor (TFT) using plasma hydrogenation with a metal shield on the TFT channel
TAIWAN SEMICONDUCTOR MFG18 citations92
US5796135AAug 18, 1998
Process to fabricate stacked capacitor dram and low power thin film transistor sram devices on a single semiconductor chip
TAIWAN SEMICONDUCTOR MFG20 citations92
US5716881AFeb 10, 1998
Process to fabricate stacked capacitor DRAM and low power thin film transistor SRAM devices on a single semiconductor chip
TAIWAN SEMICONDUCTOR MFG32 citations92
US5686335ANov 11, 1997
Method of making high-performance and reliable thin film transistor (TFT) using plasma hydrogenation with a metal shield on the TFT channel
TAIWAN SEMICONDUCTOR MFG28 citations92
US5607879AMar 4, 1997
Method for forming buried plug contacts on semiconductor integrated circuits
TAIWAN SEMICONDUCTOR MFG40 citations92
US5587696ADec 24, 1996
High resistance polysilicon resistor for integrated circuits and method of fabrication thereof
TAIWAN SEMICONDUCTOR MFG28 citations92
US5576243ANov 19, 1996
Process for forming stacked contacts and metal contacts on static random access memory having thin film transistors
TAIWAN SEMICONDUCTOR MFG19 citations92
US5547892AAug 20, 1996
Process for forming stacked contacts and metal contacts on static random access memory having thin film transistors
TAIWAN SEMICONDUCTOR MFG35 citations92
US5545585AAug 13, 1996
Method of making a dram circuit with fin-shaped stacked capacitors
TAIWAN SEMICONDUCTOR MFG42 citations92
US5545584AAug 13, 1996
Unified contact plug process for static random access memory (SRAM) having thin film transistors
TAIWAN SEMICONDUCTOR MFG53 citations92
US6046103AApr 4, 2000
Borderless contact process for a salicide devices
TAIWAN SEMICONDUCTOR MFG33 citations91
US7061028B2Jun 13, 2006
Image sensor device and method to form image sensor device
TAIWAN SEMICONDUCTOR MFG23 citations89
US8383440B2Feb 26, 2013
Light shield for CMOS imager
TAIWAN SEMICONDUCTOR MFG5 citations84
US8368130B2Feb 5, 2013
Method and device to reduce dark current in image sensors
TAIWAN SEMICONDUCTOR MFG6 citations84
US8054371B2Nov 8, 2011
Color filter for image sensor
TAIWAN SEMICONDUCTOR MFG13 citations84
US7485940B2Feb 3, 2009
Guard ring structure for improving crosstalk of backside illuminated image sensor
TAIWAN SEMICONDUCTOR MFG9 citations84
US7282757B2Oct 16, 2007
MIM capacitor structure and method of manufacture
TAIWAN SEMICONDUCTOR MFG15 citations84
US7208369B2Apr 24, 2007
Dual poly layer and method of manufacture
TAIWAN SEMICONDUCTOR MFG11 citations84
US6982443B2Jan 3, 2006
Hollow dielectric for image sensor
TAIWAN SEMICONDUCTOR MFG11 citations84
US6232194B1May 15, 2001
Silicon nitride capped poly resistor with SAC process
TAIWAN SEMICONDUCTOR MFG18 citations84
US5926697AJul 20, 1999
Method of forming a moisture guard ring for integrated circuit applications
TAIWAN SEMICONDUCTOR MFG18 citations84
US7038232B2May 2, 2006
Quantum efficiency enhancement for CMOS imaging sensor with borderless contact
TAIWAN SEMICONDUCTOR MFG11 citations83
US7847847B2Dec 7, 2010
Structure for CMOS image sensor with a plurality of capacitors
TAIWAN SEMICONDUCTOR MFG7 citations74
US7732844B2Jun 8, 2010
Crosstalk improvement through P on N structure for image sensor
TAIWAN SEMICONDUCTOR MFG5 citations74
US7332368B2Feb 19, 2008
Light guide for image sensor
TAIWAN SEMICONDUCTOR MFG5 citations74
US6707080B2Mar 16, 2004
Method for making spectrally efficient photodiode structures for CMOS color imagers
TAIWAN SEMICONDUCTOR MFG9 citations74
LIU JEN-CHENG
2 patentsTAIWAN SEMICONDUCTOR MFG CO LTD
1 patentShowing the top 50 of 105 patents by PatentIndex Score.