Inventor
HUANG YEN-BIN
TW6 patents
⚠️ This page may combine multiple inventors who share the name “HUANG YEN-BIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG
4 patentsUS7819980B2Oct 26, 2010
System and method for removing particles in semiconductor manufacturing
TAIWAN SEMICONDUCTOR MFG4 citations61
US7759136B2Jul 20, 2010
Critical dimension (CD) control by spectrum metrology
TAIWAN SEMICONDUCTOR MFG4 citations59
US8046860B2Nov 1, 2011
System and method for removing particles in semiconductor manufacturing
TAIWAN SEMICONDUCTOR MFG0 citations50
US7460251B2Dec 2, 2008
Dimension monitoring method and system
TAIWAN SEMICONDUCTOR MFG0 citations48