Inventor

KIYOKAWA TOSHIYUKI

JP29 patents

⚠️ This page may combine multiple inventors who share the name “KIYOKAWA TOSHIYUKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

KIYOKAWA TOSHIYUKI

ADVANTEST CORP

Electric device testing apparatus

IC test equipment

IC chip tester with heating element for preventing condensation

Contact arm and electronic device testing apparatus using the same

Contact arm and electronic device testing apparatus using the same

Device for detecting proper mounting of an IC for testing in an IC testing apparatus

Semiconductor device transporting and handling apparatus

Integrated circuit transporting apparatus including a guide with an integrated circuit positioning function

Semiconductor device transport system with deformed tray compensation

Test section for use in an IC handler

Tray installation rack for test handler

IC test equipment

Test carrier and electronic component testing apparatus

Electronic device handling apparatus and electronic device testing apparatus

Test carrier

Electronic part test apparatus

IC module insert

Test carrier and carrier assembling apparatus

Test carrier and carrier assembling apparatus

Test carrier and carrier assembling apparatus

Test carrier and carrier assembling apparatus

Test carrier and carrier assembling apparatus

KIYOKAWA TOSHIYUKI

Test apparatus and test method

Test apparatus, test method and computer readable medium

Wafer tray and test apparatus

Semiconductor wafer test apparatus

ADVANTEST TEST SOLUTIONS INC

Ergonomic loading for a test interface board (TIB) / burn-in-board (BIB) in a slot-based test system

Passive carrier-based device delivery for slot-based high-volume semiconductor test system

Passive carrier-based device delivery for slot-based high-volume semiconductor test system