P

Inventor

UMEMURA YOSHIHARU

JP12 patents
⚠️ This page may combine multiple inventors who share the name “UMEMURA YOSHIHARU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

KOMOTO YOSHIO

3 patents
US8289040B2Oct 16, 2012

Test wafer unit and test system

KOMOTO YOSHIO11 citations82
US8134379B2Mar 13, 2012

Probe wafer, probe device, and testing system

KOMOTO YOSHIO3 citations60
US8427187B2Apr 23, 2013

Probe wafer, probe device, and testing system

KOMOTO YOSHIO1 citations49

ADVANTEST CORP

3 patents
US7389190B2Jun 17, 2008

Testing apparatus for testing a device under test and comparator circuit and calibration apparatus for the testing apparatus

ADVANTEST CORP5 citations62
US7342407B2Mar 11, 2008

Temperature compensation circuit and testing apparatus

ADVANTEST CORP3 citations61
US7208982B2Apr 24, 2007

Sampling circuit

ADVANTEST CORP0 citations46

UMEMURA YOSHIHARU

3 patents
US8598902B2Dec 3, 2013

Probe, electronic device test apparatus, and method of producing the same

UMEMURA YOSHIHARU3 citations59
US8410807B2Apr 2, 2013

Test system and probe apparatus

UMEMURA YOSHIHARU4 citations59
US8779791B2Jul 15, 2014

Method of manufacturing probe having boards connected by magnets

UMEMURA YOSHIHARU2 citations56

HITACHI LTD

2 patents
US6774680B2Aug 10, 2004

Comparator including a differential transistor pair and a diode arrangement

HITACHI LTD8 citations68
US4144512AMar 13, 1979

AFC voltage superimposing circuit for electronic tuner

HITACHI LTD2 citations61

KIYOKAWA TOSHIYUKI

1 patent
US8513962B2Aug 20, 2013

Wafer tray and test apparatus

KIYOKAWA TOSHIYUKI16 citations82