Inventor
HYUN SANG-JIN
KR93 patents
⚠️ This page may combine multiple inventors who share the name “HYUN SANG-JIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
39 patentsUS10079210B2Sep 18, 2018
Integrated circuit device and method of fabricating the same
SAMSUNG ELECTRONICS CO LTD32 citations93
US10734280B2Aug 4, 2020
Integrated circuit devices and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD14 citations85
US10714579B2Jul 14, 2020
Semiconductor devices including recessed source/drain silicides and methods of forming the same
SAMSUNG ELECTRONICS CO LTD11 citations85
US7972950B2Jul 5, 2011
Method of fabricating semiconductor device having dual gate
SAMSUNG ELECTRONICS CO LTD8 citations84
US7053006B2May 30, 2006
Methods of fabricating oxide layers by plasma nitridation and oxidation
SAMSUNG ELECTRONICS CO LTD11 citations84
US11411124B2Aug 9, 2022
Semiconductor devices
SAMSUNG ELECTRONICS CO LTD4 citations83
US10559687B2Feb 11, 2020
Semiconductor device
SAMSUNG ELECTRONICS CO LTD7 citations83
US10381490B2Aug 13, 2019
Semiconductor devices
SAMSUNG ELECTRONICS CO LTD8 citations83
US10312340B2Jun 4, 2019
Semiconductor devices having work function metal films and tuning materials
SAMSUNG ELECTRONICS CO LTD6 citations83
US10283600B2May 7, 2019
Integrated circuit device
SAMSUNG ELECTRONICS CO LTD13 citations83
US9806075B2Oct 31, 2017
Integrated circuit devices having a Fin-type active region and methods of manufacturing the same
SAMSUNG ELECTRONICS CO LTD9 citations83
US10566326B2Feb 18, 2020
Semiconductor devices including a device isolation region in a substrate and/or fin
SAMSUNG ELECTRONICS CO LTD7 citations82
US9240483B2Jan 19, 2016
Fin-type field effect transistors including aluminum doped metal-containing layer
SAMSUNG ELECTRONICS CO LTD10 citations81
US11282939B2Mar 22, 2022
Semiconductor device including work function adjusting metal gate structure
SAMSUNG ELECTRONICS CO LTD4 citations73
US9543300B2Jan 10, 2017
CMOS transistor, semiconductor device including the transistor, and semiconductor module including the device
SAMSUNG ELECTRONICS CO LTD2 citations73
US9252058B2Feb 2, 2016
Semiconductor device and method of fabricating the same
SAMSUNG ELECTRONICS CO LTD3 citations73
US11799004B2Oct 24, 2023
Semiconductor device
SAMSUNG ELECTRONICS CO LTD1 citations72
US11296196B2Apr 5, 2022
Semiconductor device and method for fabricating the same
SAMSUNG ELECTRONICS CO LTD3 citations72
US10923602B2Feb 16, 2021
Semiconductor devices
SAMSUNG ELECTRONICS CO LTD3 citations72
US10600913B2Mar 24, 2020
Semiconductor device and method for fabricating the same
SAMSUNG ELECTRONICS CO LTD4 citations72
US10593670B2Mar 17, 2020
Methods of manufacturing integrated circuit devices having a fin-type active region
SAMSUNG ELECTRONICS CO LTD3 citations72
US10529817B2Jan 7, 2020
Semiconductor devices having multi-threshold voltage
SAMSUNG ELECTRONICS CO LTD3 citations72
US10403717B2Sep 3, 2019
Semiconductor devices including contact structures that partially overlap silicide layers
SAMSUNG ELECTRONICS CO LTD2 citations72
US10366955B2Jul 30, 2019
Semiconductor device including conductive structure having nucleation structure and method of forming the same
SAMSUNG ELECTRONICS CO LTD1 citations72
US11114544B2Sep 7, 2021
Integrated circuit device having fin-type active
SAMSUNG ELECTRONICS CO LTD2 citations71
US11018050B2May 25, 2021
Semiconductor device and method of fabricating the same
SAMSUNG ELECTRONICS CO LTD2 citations71
US10879392B2Dec 29, 2020
Semiconductor device
SAMSUNG ELECTRONICS CO LTD3 citations71
US10847515B2Nov 24, 2020
Semiconductor devices with nanowires and methods for fabricating the same
SAMSUNG ELECTRONICS CO LTD2 citations71
US10756195B2Aug 25, 2020
Integrated circuit device and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD2 citations71
US10557198B2Feb 11, 2020
Gas distribution apparatus and substrate processing apparatus including the same
SAMSUNG ELECTRONICS CO LTD3 citations71
US10340358B2Jul 2, 2019
Semiconductor device and method for fabricating the same
SAMSUNG ELECTRONICS CO LTD6 citations71
US10269629B2Apr 23, 2019
Semiconductor device and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD4 citations71
US10177149B2Jan 8, 2019
Semiconductor devices with nanowires and with metal layers having different grain sizes
SAMSUNG ELECTRONICS CO LTD2 citations71
US10177042B2Jan 8, 2019
Semiconductor device and method for fabricating the same
SAMSUNG ELECTRONICS CO LTD3 citations71
US10134856B2Nov 20, 2018
Semiconductor device including contact plug and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD3 citations71
US10128245B2Nov 13, 2018
Semiconductor devices including active areas with increased contact area
SAMSUNG ELECTRONICS CO LTD4 citations71
US10115797B2Oct 30, 2018
Finfet semiconductor device and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD2 citations71
US10686069B2Jun 16, 2020
Semiconductor device having vertical channel
SAMSUNG ELECTRONICS CO LTD5 citations68
US9236313B2Jan 12, 2016
Method of fabricating semiconductor device having dual gate
SAMSUNG ELECTRONICS CO LTD1 citations63
NA HOON-JOO
2 patentsUS8748251B2Jun 10, 2014
Methods for manufacturing semiconductor devices using etch stop dielectric layers and related devices
NA HOON-JOO10 citations82
US8293599B2Oct 23, 2012
Methods of forming semiconductor devices having gates with different work functions using selective injection of diffusion inhibiting materials
NA HOON-JOO12 citations82
PARK MOON-KYU
1 patentSAMSUNG ELECTRONICS CO INC
1 patentKIM WAN-DON
1 patentPARK HONG-BAE
1 patentLEE HYE-LAN
1 patentLEE DONG-SOO
1 patentHONG HYUNG-SEOK
1 patentSON HYEOK-JUN
1 patentLEE DO-SUN
1 patentShowing the top 50 of 93 patents by PatentIndex Score.