Inventor
WATANABE HEIJI
JP34 patents
⚠️ This page may combine multiple inventors who share the name “WATANABE HEIJI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ROHM CO LTD
15 patentsUS9496393B2Nov 15, 2016
Semiconductor device
ROHM CO LTD12 citations92
US9257521B2Feb 9, 2016
Semiconductor device
ROHM CO LTD10 citations92
US8969877B2Mar 3, 2015
Semiconductor device
ROHM CO LTD10 citations92
US11777030B2Oct 3, 2023
Semiconductor device
ROHM CO LTD2 citations84
US11296223B2Apr 5, 2022
Semiconductor device
ROHM CO LTD5 citations84
US10804392B2Oct 13, 2020
Semiconductor device
ROHM CO LTD5 citations84
US10546954B2Jan 28, 2020
Semiconductor device
ROHM CO LTD6 citations84
US10833166B2Nov 10, 2020
Semiconductor device including an MIS structure
ROHM CO LTD2 citations72
US9397185B2Jul 19, 2016
Semiconductor device
ROHM CO LTD4 citations72
US12439634B2Oct 7, 2025
Semiconductor device
ROHM CO LTD0 citations62
US11610992B2Mar 21, 2023
Semiconductor device
ROHM CO LTD0 citations62
US11043589B2Jun 22, 2021
Semiconductor device
ROHM CO LTD0 citations62
US9893180B2Feb 13, 2018
Semiconductor device
ROHM CO LTD1 citations62
US10319853B2Jun 11, 2019
Semiconductor device
ROHM CO LTD0 citations52
US9368351B2Jun 14, 2016
Semiconductor device and method for manufacturing same
ROHM CO LTD0 citations52
NEC CORP
4 patentsUS7151299B2Dec 19, 2006
Semiconductor device and its manufacturing method
NEC CORP5 citations63
US7679148B2Mar 16, 2010
Semiconductor device, production method and production device thereof
NEC CORP4 citations62
US7495264B2Feb 24, 2009
Semiconductor device with high dielectric constant insulating film and manufacturing method for the same
NEC CORP0 citations50
US7164169B2Jan 16, 2007
Semiconductor device having high-permittivity insulation film and production method therefor
NEC CORP0 citations50
SHIMADZU CORP
3 patentsUNIV OSAKA
3 patentsUS10103232B2Oct 16, 2018
Semiconductor device and method for manufacturing semiconductor device
UNIV OSAKA0 citations49
US9805944B2Oct 31, 2017
Method of manufacturing silicon carbide semiconductor device
UNIV OSAKA0 citations49
US10755920B2Aug 25, 2020
Method for manufacturing semiconductor device and semiconductor manufacturing apparatus used for the method
UNIV OSAKA0 citations39