Inventor

NICKEL JOCHEN

DE2 patents

Patents

2 patents

US7015906B2Mar 21, 2006

Method and arrangement for imaging and measuring microscopic three-dimensional structures

LEICA MICROSYSTEMS32 citations88

US7120281B2Oct 10, 2006

Method; microscope system and software program for the observation of dynamic processes

LEICA MICROSYSTEMS2 citations58