Inventor

NOIFELD Efrat

IL2 patents

Patents

2 patents

US11651509B2May 16, 2023

Method, system and computer program product for 3D-NAND CDSEM metrology

APPLIED MATERIALS ISRAEL LTD0 citations51

US9824852B2Nov 21, 2017

CD-SEM technique for wafers fabrication control

APPLIED MATERIALS ISRAEL LTD0 citations43