Inventor

KUDINAR RUSMIN

US39 patents

⚠️ This page may combine multiple inventors who share the name “KUDINAR RUSMIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

KUDINAR RUSMIN

CANDELA INSTR

Combined high speed optical profilometer and ellipsometer

High speed optical profilometer for measuring surface height variation

System for simultaneously measuring thin film layer thickness, reflectivity, roughness, surface profile and magnetic pattern

System and method for measuring thin film properties and analyzing two-dimensional histograms using and/not operations

System and method for measuring thin film properties and analyzing two-dimensional histograms using substraction operation

System and method for measuring thin film properties and analyzing two-dimensional histograms using a symmetry operation

System and method for simultaneously measuring lubricant thickness and degradation, thin film thickness and wear, and surface roughness

System and method for simultaneously measuring thin film layer thickness, reflectivity, roughness, surface profile and magnetic pattern in thin film magnetic disks and silicon wafers

ZETA INSTR INC

Multi-surface optical inspector

Multi-surface specular reflection inspector

Method of detecting defect location using multi-surface specular reflection

3D microscope and methods of measuring patterned substrates

Multi-surface optical 3D microscope

Multi-surface optical 3D microscope

Dual mode inspector

KLA TENCOR CORP

Wafer edge inspection

Wafer edge inspection

3D microscope including insertable components to provide multiple imaging and measurement capabilities

3D microscope including insertable components to provide multiple imaging and measurement capabilities

3D microscope including insertable components to provide multiple imaging and measurement capabilities

3D microscope including insertable components to provide multiple imaging and measurement capabilities

KLA TENCOR TECH CORP

System and method for measuring object characteristics using phase differences in polarized light reflections

Wafer edge inspection

Wafer edge inspection

Combined high speed optical profilometer and ellipsometer

Combined high speed optical profilometer and ellipsometer

MEEKS STEVEN W

Multi-surface scattered radiation differentiation

Optical inspector with selective scattered radiation blocker

Optical inspector

Optical inspector

TENCOR INSTRUMENTS

Constant-force profilometer with stylus-stabilizing sensor assembly, dual-view optics, and temperature drift compensation

Wafer handling apparatus

XU JAMES JIANGUO

3D microscope including insertable components to provide multiple imaging and measurement capabilities

System and method for monitoring LED chip surface roughening process

KLA TENCOR TECHNOLOGIES

System and method for measuring properties of an object using a phase difference between two reflected light signals

CANDELA INSTR INC

High temperature thin film property measurement system and method

HOU ZHEN

3D microscope and methods of measuring patterned substrates

LEE KEN KINSUN

Multi-surface optical 3D microscope

KUDINAR RUSMIN

Interchangeable disk clamp