Inventor
LEPAGE BENOIT
CA50 patents
⚠️ This page may combine multiple inventors who share the name “LEPAGE BENOIT”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
EVIDENT CANADA INC
11 patentsUS12013373B2Jun 18, 2024
Free-encoder positioning system using acoustic features and IMU
EVIDENT CANADA INC2 citations71
US12352727B2Jul 8, 2025
Acoustic imaging techniques using machine learning
EVIDENT CANADA INC0 citations62
US11933765B2Mar 19, 2024
Ultrasound inspection techniques for detecting a flaw in a test object
EVIDENT CANADA INC0 citations62
US11933766B2Mar 19, 2024
Material profiling for improved sizing accuracy
EVIDENT CANADA INC0 citations60
US11906468B2Feb 20, 2024
Acoustic profiling techniques for non-destructive testing
EVIDENT CANADA INC0 citations55
US12510662B2Dec 30, 2025
Volumetric inspection using row-column addressed probe
EVIDENT CANADA INC0 citations52
US12436131B2Oct 7, 2025
High temperature ECA probe
EVIDENT CANADA INC0 citations52
US12480914B2Nov 25, 2025
Adaptive ultrasonic inspection for volumetric flaws
EVIDENT CANADA INC0 citations51
US12372499B2Jul 29, 2025
Ultrasound inspection calibration using a target
EVIDENT CANADA INC0 citations50
US12474300B2Nov 18, 2025
Lift-off compensated eddy current system
EVIDENT CANADA INC0 citations45
US12153132B2Nov 26, 2024
Techniques to reconstruct data from acoustically constructed images using machine learning
EVIDENT CANADA INC0 citations44
LEPAGE BENOIT
9 patentsUS8704513B2Apr 22, 2014
Shielded eddy current coils and methods for forming same on printed circuit boards
LEPAGE BENOIT8 citations83
US9625424B2Apr 18, 2017
System and a method of automatically generating a phased array ultrasound scan plan for non-destructive inspection
LEPAGE BENOIT10 citations80
US8896300B2Nov 25, 2014
2D coil and a method of obtaining EC response of 3D coils using the 2D coil configuration
LEPAGE BENOIT2 citations62
US8700342B2Apr 15, 2014
Multi-frequency bond testing
LEPAGE BENOIT3 citations60
US9110036B2Aug 18, 2015
Assembly with a universal manipulator for inspecting dovetail of different sizes
LEPAGE BENOIT1 citations51
US9316618B2Apr 19, 2016
Method for monitoring the integrity of an eddy current inspection channel
LEPAGE BENOIT0 citations41
US8519702B2Aug 27, 2013
Orthogonal eddy current probe for multi-directional inspection
LEPAGE BENOIT0 citations41
US9523660B2Dec 20, 2016
Method of conducting probe coupling calibration in a guided-wave inspection instrument
LEPAGE BENOIT0 citations39
US10561404B2Feb 18, 2020
Gapless calibration method for phased array ultrasonic inspection
LEPAGE BENOIT0 citations33
OLYMPUS NDT CANADA INC
7 patentsUS11327053B2May 10, 2022
In-line tube inspection
OLYMPUS NDT CANADA INC0 citations62
US11474075B2Oct 18, 2022
Total focusing method (TFM) with acoustic path filtering
OLYMPUS NDT CANADA INC0 citations60
US11448621B2Sep 20, 2022
Ultrasound probe with row-column addressed array
OLYMPUS NDT CANADA INC0 citations60
US11408860B2Aug 9, 2022
Ultrasound probe with row-column addressed array
OLYMPUS NDT CANADA INC0 citations60
US11474076B2Oct 18, 2022
Acoustic model acoustic region of influence generation
OLYMPUS NDT CANADA INC1 citations58
US11525805B2Dec 13, 2022
Non-contact speed encoder
OLYMPUS NDT CANADA INC0 citations51
US11467129B2Oct 11, 2022
NDT data referencing system
OLYMPUS NDT CANADA INC0 citations51
OLYMPUS AMERICA INC
4 patentsUS11249053B2Feb 15, 2022
Ultrasonic inspection configuration with beam overlap verification
OLYMPUS AMERICA INC0 citations62
US10775346B2Sep 15, 2020
Virtual channels for eddy current array probes
OLYMPUS AMERICA INC0 citations52
US11029289B2Jun 8, 2021
Ultrasonic TFM with calculated angle beams
OLYMPUS AMERICA INC0 citations50
US10908122B2Feb 2, 2021
Total focusing method adaptively corrected by using plane wave
OLYMPUS AMERICA INC0 citations50
OLYMPUS NDT
3 patentsUS8049494B2Nov 1, 2011
Flexible array probe for the inspection of a contoured surface with varying cross-sectional geometry
OLYMPUS NDT14 citations82
US8018228B2Sep 13, 2011
High resolution and flexible eddy current array probe
OLYMPUS NDT7 citations82
US7505859B2Mar 17, 2009
Method and algorithms for inspection of longitudinal defects in an eddy current inspection system
OLYMPUS NDT2 citations58