Inventor
LIN TZU-CHIN
TW21 patents
⚠️ This page may combine multiple inventors who share the name “LIN TZU-CHIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MEDIATEK INC
7 patentsUS11835645B2Dec 5, 2023
Reconfigurable RF front end and antenna arrays for radar mode switching
MEDIATEK INC2 citations73
US11693089B2Jul 4, 2023
Apparatus and method for applying frequency calibration to local oscillator signal derived from reference clock output of active oscillator
MEDIATEK INC0 citations61
US11677433B2Jun 13, 2023
Wireless system having local oscillator signal derived from reference clock output of active oscillator that has no electromechanical resonator
MEDIATEK INC0 citations61
US11237249B2Feb 1, 2022
Apparatus and method for applying frequency calibration to local oscillator signal derived from reference clock output of active oscillator that has no electromechanical resonator
MEDIATEK INC0 citations61
US12028099B2Jul 2, 2024
Semiconductor chip with local oscillator buffer reused for loop-back test and associated loop-back test method
MEDIATEK INC0 citations60
US11695439B2Jul 4, 2023
Semiconductor chip with local oscillator buffer reused for signal transmission and associated transmission method
MEDIATEK INC0 citations60
US11601147B2Mar 7, 2023
Semiconductor chip with local oscillator buffer reused for loop-back test and associated loop-back test method
MEDIATEK INC1 citations60
TAIWAN SEMICONDUCTOR MFG
6 patentsUS8954899B2Feb 10, 2015
Contour alignment system
TAIWAN SEMICONDUCTOR MFG60 citations95
US8841049B2Sep 23, 2014
Electron beam data storage system and method for high volume manufacturing
TAIWAN SEMICONDUCTOR MFG28 citations92
US8949749B2Feb 3, 2015
Layout design for electron-beam high volume manufacturing
TAIWAN SEMICONDUCTOR MFG12 citations82
US8806392B2Aug 12, 2014
Distinguishable IC patterns with encoded information
TAIWAN SEMICONDUCTOR MFG2 citations62
US9336986B2May 10, 2016
Electron beam data storage system and method for high volume manufacturing
TAIWAN SEMICONDUCTOR MFG0 citations51
US9189587B2Nov 17, 2015
Chip level critical point analysis with manufacturer specific data
TAIWAN SEMICONDUCTOR MFG1 citations51
WANG HUNG-CHUN
4 patentsUS8601407B2Dec 3, 2013
Geometric pattern data quality verification for maskless lithography
WANG HUNG-CHUN31 citations92
US8473877B2Jun 25, 2013
Striping methodology for maskless lithography
WANG HUNG-CHUN26 citations92
US8468473B1Jun 18, 2013
Method for high volume e-beam lithography
WANG HUNG-CHUN34 citations92
US8507159B2Aug 13, 2013
Electron beam data storage system and method for high volume manufacturing
WANG HUNG-CHUN29 citations91