Inventor
CHUNG LEE NI
US2 patents
Patents
2 patentsUS7302625B1Nov 27, 2007
Built-in self test (BIST) technology for testing field programmable gate arrays (FPGAs) using partial reconfiguration
XILINX INC79 citations94
US8030954B1Oct 4, 2011
Internal voltage level shifting for screening cold or hot temperature defects using room temperature testing
XILINX INC1 citations41