Inventor
KODAMA CHIKAAKI
JP39 patents
⚠️ This page may combine multiple inventors who share the name “KODAMA CHIKAAKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOSHIBA KK
14 patentsUS7777348B2Aug 17, 2010
Semiconductor device
TOSHIBA KK9 citations84
US8972907B1Mar 3, 2015
Layout correcting method, recording medium and design layout correcting apparatus
TOSHIBA KK7 citations80
US7998642B2Aug 16, 2011
Mask pattern data creation method and mask
TOSHIBA KK3 citations62
US7713833B2May 11, 2010
Method for manufacturing semiconductor device
TOSHIBA KK4 citations62
US9583437B2Feb 28, 2017
Manufacturing method of a semiconductor device and method for creating a layout thereof
TOSHIBA KK0 citations52
US9209070B2Dec 8, 2015
Manufacturing method of a semiconductor device and method for creating a layout thereof
TOSHIBA KK0 citations52
US8347241B2Jan 1, 2013
Pattern generation method, computer-readable recording medium, and semiconductor device manufacturing method
TOSHIBA KK1 citations52
USRE46100EAug 9, 2016
Method of fabricating semiconductor device and semiconductor device
TOSHIBA KK0 citations51
US9177854B2Nov 3, 2015
Method of manufacturing semiconductor device using sidewall films for pitch multiplication in forming interconnects
TOSHIBA KK1 citations51
US9086634B2Jul 21, 2015
Production method and evaluation apparatus for mask layout
TOSHIBA KK1 citations51
US9698157B2Jul 4, 2017
Microstructure device and method for manufacturing the same
TOSHIBA KK0 citations50
US9576100B2Feb 21, 2017
Pattern data generation method, pattern verification method, and optical image calculation method
TOSHIBA KK0 citations50
US8984454B2Mar 17, 2015
Pattern data generation method, pattern verification method, and optical image calculation method
TOSHIBA KK0 citations50
US9257367B2Feb 9, 2016
Integrated circuit device, method for producing mask layout, and program for producing mask layout
TOSHIBA KK1 citations49
TOSHIBA MEMORY CORP
8 patentsUS9806021B2Oct 31, 2017
Manufacturing method of a semiconductor device and method for creating a layout thereof
TOSHIBA MEMORY CORP8 citations92
US10854546B2Dec 1, 2020
Manufacturing method of a semiconductor device and method for creating a layout thereof
TOSHIBA MEMORY CORP3 citations84
US10163790B2Dec 25, 2018
Manufacturing method of a semiconductor device and method for creating a layout thereof
TOSHIBA MEMORY CORP5 citations84
US10198546B2Feb 5, 2019
Assist pattern arrangement method and recording medium
TOSHIBA MEMORY CORP3 citations73
US9977855B2May 22, 2018
Method of wiring layout, semiconductor device, program for supporting design of wiring layout, and method for manufacturing semiconductor device
TOSHIBA MEMORY CORP2 citations72
US9953126B2Apr 24, 2018
Method of wiring layout, semiconductor device, program for supporting design of wiring layout, and method for manufacturing semiconductor device
TOSHIBA MEMORY CORP4 citations72
US10490499B2Nov 26, 2019
Manufacturing method of a semiconductor device and method for creating a layout thereof
TOSHIBA MEMORY CORP0 citations52
US9917049B2Mar 13, 2018
Semiconductor device having contacts in drawing area and the contacts connected to word lines extending from element formation area
TOSHIBA MEMORY CORP0 citations51
KIOXIA CORP
3 patentsUS11417600B2Aug 16, 2022
Manufacturing method of a semiconductor device and method for creating a layout thereof
KIOXIA CORP3 citations84
US11990406B2May 21, 2024
Manufacturing method of a semiconductor device and method for creating a layout thereof
KIOXIA CORP2 citations73
US12456680B2Oct 28, 2025
Manufacturing method of a semiconductor device and method for creating a layout thereof
KIOXIA CORP0 citations62
KODAMA CHIKAAKI
3 patentsUS8809072B2Aug 19, 2014
Sub-resolution assist feature arranging method and computer program product and manufacturing method of semiconductor device
KODAMA CHIKAAKI1 citations49
US8609303B2Dec 17, 2013
Mask pattern generating method and computer program product
KODAMA CHIKAAKI0 citations44
US8110413B2Feb 7, 2012
Mask pattern verification apparatus, mask pattern verification method and method of fabricating a semiconductor device
KODAMA CHIKAAKI0 citations27
YANAGIDAIRA KOSUKE
2 patentsTAGUCHI TAKAFUMI
2 patentsFUJITSU LTD
2 patentsMASHITA HIROMITSU
2 patentsUS8143171B2Mar 27, 2012
Method for manufacturing semiconductor device and computer readable medium for storing pattern size setting program
MASHITA HIROMITSU3 citations60
US8617999B2Dec 31, 2013
Method of manufacturing semiconductor device and computer readable medium for storing pattern size setting program
MASHITA HIROMITSU0 citations50