Inventor
INOUE KEIKO
JP12 patents
⚠️ This page may combine multiple inventors who share the name “INOUE KEIKO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NEC CORP
10 patentsUS12360054B2Jul 15, 2025
Inspection system
NEC CORP1 citations62
US12026870B2Jul 2, 2024
Manufacturing management method
NEC CORP0 citations62
US11812131B2Nov 7, 2023
Determination of appropriate image suitable for feature extraction of object from among captured images in which object is detected
NEC CORP0 citations62
US12597112B2Apr 7, 2026
Inspection device, inspection method, and recording medium
NEC CORP0 citations61
US12536635B2Jan 27, 2026
Grasping device
NEC CORP0 citations61
US11989799B2May 21, 2024
Visualized image display device
NEC CORP0 citations51
US12437416B2Oct 7, 2025
Determination apparatus
NEC CORP0 citations50
US12529661B2Jan 20, 2026
Inspection apparatus
NEC CORP0 citations49
US12148143B2Nov 19, 2024
Product-inspection apparatus, product-inspection method, and non-transitory computer readable medium
NEC CORP0 citations49
US11961269B2Apr 16, 2024
Apparatus, method and non-transitory computer-readable medium storing program for controlling imaging environment of target object
NEC CORP0 citations49