Inventor

NAMKOONG WHAN

KR2 patents

Patents

2 patents

US9087729B2Jul 21, 2015

Semiconductor devices including unitary supports

SAMSUNG ELECTRONICS CO LTD12 citations81

US7466428B2Dec 16, 2008

Method of measuring thickness of thin layer in semiconductor device and apparatus for performing method

SAMSUNG ELECTRONICS CO LTD2 citations53