Inventor
OHSAWA TOSHIMI
JP7 patents
Patents
7 patentsUS5646948AJul 8, 1997
Apparatus for concurrently testing a plurality of semiconductor memories in parallel
ADVANTEST CORP81 citations94
US6513138B1Jan 28, 2003
Pattern generator for semiconductor test system
ADVANTEST CORP22 citations91
US5717694AFeb 10, 1998
Fail analysis device for semiconductor memory test system
ADVANTEST CORP38 citations91
US5673271ASep 30, 1997
High speed pattern generator
ADVANTEST CORP32 citations91
US5644578AJul 1, 1997
Failure memory device
ADVANTEST CORP50 citations91
US7441166B2Oct 21, 2008
Testing apparatus and testing method
ADVANTEST CORP9 citations82
US5682393AOct 28, 1997
Pattern generator for cycle delay
ADVANTEST CORP13 citations72