Inventor

HUNG CHI-CHENG

TW75 patents

⚠️ This page may combine multiple inventors who share the name “HUNG CHI-CHENG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

HUNG CHI-CHENG

TAIWAN SEMICONDUCTOR MFG CO LTD

FinFET gate structure and method for fabricating the same

Methods for forming contact plugs with reduced corrosion

FinFET structures and methods of forming the same

Pattern fidelity enhancement with directional patterning technology

Methods for forming contact plugs with reduced corrosion

Methods for forming contact plugs with reduced corrosion

FinFET gate structure and method for fabricating the same

Directional patterning methods

Semiconductor device and manufacturing method thereof

Semiconductor structure and manufacturing method thereof

FinFET structures and methods of forming the same

FinFET structures and methods of forming the same

Semiconductor device and method

Methods for improved critical dimension uniformity in a semiconductor device fabrication process

Semiconductor device and methods of manufacture

FinFET structures and methods of forming the same

N-work function metal with crystal structure

Semiconductor device and manufacturing method thereof

Semiconductor device and method

Lithographic technique incorporating varied pattern materials

Formation of copper layer structure with self anneal strain improvement

Method of forming features with various dimensions

Fin patterning methods for increased process margin

Semiconductor device and method for manufacturing the same

Metal gate and manufacturing method thereof

Lithography process and system with enhanced overlay quality

FinFET structures and methods of forming the same

Semiconductor device and methods of manufacture

Semiconductor device and methods of manufacture

Semiconductor device and manufacturing method thereof

Semiconductor device with dielectric spacer liner on source/drain contact

Metal adhesion layer to promote metal plug adhesion

Method for improved critical dimension uniformity in a semiconductor device fabrication process

Semiconductor device with dielectric spacer liner on source/drain contact

Method for improved critical dimension uniformity in a semiconductor device fabrication process

Pattern fidelity enhancement with directional patterning technology

N-work function metal with crystal structure

N-work function metal with crystal structure

Methods for forming contact plugs with reduced corrosion

Semiconductor device and manufacturing process thereof

Method of fabricating tantalum nitride barrier layer and semiconductor device thereof

Formation of copper layer structure with self anneal strain improvement

WINBOND ELECTRONICS CORP

Serial data timing base modulator

Scaled video output overlaid onto a computer graphics output

Direct data access between input and output ports

SDI CORP

Cutter knife

Cutter assembly having dual locking effect

TAIWAN SEMICONDUCTOR MFG

Hard mask removal for semiconductor devices

HUNG CHI-CHENG

Reverse planarization method

LYONTEK INC

Capacity dividable memory IC