Inventor
MINAKAWA TSUYOSHI
FR20 patents
⚠️ This page may combine multiple inventors who share the name “MINAKAWA TSUYOSHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI LTD
10 patentsUS7990415B2Aug 2, 2011
Image input device and calibration method
HITACHI LTD9 citations83
US11188567B2Nov 30, 2021
Data analysis support apparatus and data analysis support system
HITACHI LTD1 citations60
US11803930B2Oct 31, 2023
Timetable modification device and automatic train control system
HITACHI LTD1 citations51
US11710087B2Jul 25, 2023
Replanned plan output device
HITACHI LTD0 citations50
US12509132B2Dec 30, 2025
Operation plan change assistance device, operation plan change assistance method, and rail traffic management system
HITACHI LTD0 citations47
US12307395B2May 20, 2025
Timetable planning system and timetable generating method
HITACHI LTD0 citations47
US12280813B2Apr 22, 2025
Train operation support system and train operation support method
HITACHI LTD0 citations47
US11754404B2Sep 12, 2023
Transport navigation system and transport navigation method
HITACHI LTD0 citations47
US12393897B2Aug 19, 2025
Service plan change assistance apparatus, decision model creation apparatus, decision model creation program, and train traffic management system
HITACHI LTD0 citations46
US12254428B2Mar 18, 2025
Timetable creation apparatus, timetable creation method, and automatic vehicle control system
HITACHI LTD0 citations43
HITACHI HIGH TECH CORP
5 patentsUS9858659B2Jan 2, 2018
Pattern inspecting and measuring device and program
HITACHI HIGH TECH CORP9 citations83
US8953868B2Feb 10, 2015
Defect inspection method and defect inspection apparatus
HITACHI HIGH TECH CORP4 citations73
US10317203B2Jun 11, 2019
Dimension measuring apparatus and computer readable medium
HITACHI HIGH TECH CORP4 citations72
US10223784B2Mar 5, 2019
Pattern evaluation device and visual inspection device comprising pattern evaluation device
HITACHI HIGH TECH CORP2 citations70
US9830705B2Nov 28, 2017
Image evaluation apparatus and pattern shape evaluation apparatus
HITACHI HIGH TECH CORP0 citations41
MINAKAWA TSUYOSHI
3 patentsUS8571345B2Oct 29, 2013
Method and device for correcting image, and method and device for generating correction table for use in correction of image
MINAKAWA TSUYOSHI2 citations58
US8724922B2May 13, 2014
Image correcting device, method for creating corrected image, correction table creating device, method for creating correction table, program for creating correction table, and program for creating corrected image
MINAKAWA TSUYOSHI0 citations37
US8630506B2Jan 14, 2014
Image correcting device, method for creating corrected image, correction table creating device, method for creating correction table, program for creating correction table, and program for creating corrected image
MINAKAWA TSUYOSHI0 citations37