Inventor
SOHN YOUNG-HOON
KR14 patents
⚠️ This page may combine multiple inventors who share the name “SOHN YOUNG-HOON”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
11 patentsUS7994813B2Aug 9, 2011
Semiconductor device capable of testing a transmission line for an impedance calibration code
SAMSUNG ELECTRONICS CO LTD17 citations83
US9036895B2May 19, 2015
Method of inspecting wafer
SAMSUNG ELECTRONICS CO LTD6 citations72
US10001444B2Jun 19, 2018
Surface inspecting method
SAMSUNG ELECTRONICS CO LTD4 citations70
US10969428B2Apr 6, 2021
Method of inspecting pattern defect
SAMSUNG ELECTRONICS CO LTD0 citations62
US11181831B2Nov 23, 2021
Methods of manufacturing semiconductor device
SAMSUNG ELECTRONICS CO LTD0 citations59
US8759763B2Jun 24, 2014
Method and apparatus to measure step height of device using scanning electron microscope
SAMSUNG ELECTRONICS CO LTD1 citations51
US10527556B2Jan 7, 2020
Optical measuring method and apparatus, and method of manufacturing semiconductor device using the same
SAMSUNG ELECTRONICS CO LTD0 citations49
US11017525B2May 25, 2021
Semiconductor pattern detecting apparatus
SAMSUNG ELECTRONICS CO LTD0 citations47
US10989520B2Apr 27, 2021
Methods for nondestructive measurements of thickness of underlying layers
SAMSUNG ELECTRONICS CO LTD0 citations45
US10852259B2Dec 1, 2020
Apparatus for X-ray inspection, and a method for manufacturing a semiconductor device using the same
SAMSUNG ELECTRONICS CO LTD0 citations39
US10585115B2Mar 10, 2020
Scanning probe inspector
SAMSUNG ELECTRONICS CO LTD0 citations37