Inventor
HAGINO TAKESHI
JP20 patents
⚠️ This page may combine multiple inventors who share the name “HAGINO TAKESHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MITUTOYO CORP
12 patentsUS8356417B2Jan 22, 2013
Spherical-form measuring apparatus
MITUTOYO CORP8 citations83
US10627204B2Apr 21, 2020
Coefficient-of-thermal-expansion measurement method and measuring device for coefficient of thermal expansion
MITUTOYO CORP2 citations72
US10352678B2Jul 16, 2019
Coefficient-of-thermal-expansion measurement method of dimension reference gauge, measuring device for coefficient of thermal expansion and reference gauge
MITUTOYO CORP3 citations71
US9347771B2May 24, 2016
Spherical shape measurement method and apparatus
MITUTOYO CORP2 citations61
US8379222B2Feb 19, 2013
Fizeau interferometer and measurement method using Fizeau interferometer
MITUTOYO CORP3 citations61
US12392605B2Aug 19, 2025
Method of estimating uncertainty of coordinate measurement
MITUTOYO CORP0 citations51
US10969355B2Apr 6, 2021
Measuring device for coefficient of thermal expansion and measurement method for coefficient of thermal expansion
MITUTOYO CORP0 citations51
US10900917B2Jan 26, 2021
Measuring device for coefficient of thermal expansion and measurement method for coefficient of thermal expansion
MITUTOYO CORP0 citations51
US9518944B2Dec 13, 2016
Temperature-controlled bath
MITUTOYO CORP1 citations51
US9297631B2Mar 29, 2016
Spherical-form measuring apparatus
MITUTOYO CORP1 citations51
US11530908B2Dec 20, 2022
Measurement point determination method, non-transitory storage medium, and measurement point determination apparatus
MITUTOYO CORP0 citations48
US10444008B2Oct 15, 2019
Spherical shape measurement method and apparatus for rotating a sphere about first rotation axis and rotating a sphere hold mechanism about second rotation axis orthogonal to first rotation axis
MITUTOYO CORP0 citations40
HAGINO TAKESHI
3 patentsUS8841638B2Sep 23, 2014
Particle beam therapy system
HAGINO TAKESHI2 citations60
US8299447B2Oct 30, 2012
Rotating irradiation apparatus
HAGINO TAKESHI4 citations60
US8879068B2Nov 4, 2014
Abscissa calibration jig and abscissa calibration method of laser interference measuring apparatus
HAGINO TAKESHI2 citations59
DENSO CORP
3 patentsUS11923452B2Mar 5, 2024
Semiconductor device having semiconductor switching element in sense cell region
DENSO CORP0 citations51
US12426304B2Sep 23, 2025
Semiconductor device and method of manufacturing the same
DENSO CORP0 citations48
US12464768B2Nov 4, 2025
Vertical semiconductor swiching elements with sense cell region
DENSO CORP0 citations47