P

Inventor

PARK JAE-KWAN

US55 patents
⚠️ This page may combine multiple inventors who share the name “PARK JAE-KWAN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SAMSUNG ELECTRONICS CO LTD

17 patents
US7885114B2Feb 8, 2011

NAND flash memory devices having wiring with integrally-formed contact pads and dummy lines and methods of manufacturing the same

SAMSUNG ELECTRONICS CO LTD28 citations95
US5840591ANov 24, 1998

Method of manufacturing buried bit line DRAM cell

SAMSUNG ELECTRONICS CO LTD34 citations93
US7544565B2Jun 9, 2009

Semiconductor devices having a convex active region and methods of forming the same

SAMSUNG ELECTRONICS CO LTD30 citations92
US5866927AFeb 2, 1999

Integrated circuit devices having contact pads which are separated by sidewall spacers

SAMSUNG ELECTRONICS CO LTD24 citations90
US8357605B2Jan 22, 2013

Methods of fabricating semiconductor memory devices

SAMSUNG ELECTRONICS CO LTD7 citations84
US7626228B2Dec 1, 2009

NAND-type non-volatile memory devices having a stacked structure

SAMSUNG ELECTRONICS CO LTD18 citations84
US6865110B1Mar 8, 2005

Program voltage generation circuit for stably programming flash memory cell and method of programming flash memory cell

SAMSUNG ELECTRONICS CO LTD18 citations84
US7723775B2May 25, 2010

NAND flash memory device having a contact for controlling a well potential

SAMSUNG ELECTRONICS CO LTD8 citations83
US7968447B2Jun 28, 2011

Semiconductor device and methods of manufacturing the same

SAMSUNG ELECTRONICS CO LTD8 citations82
US6248636B1Jun 19, 2001

Method for forming contact holes of semiconductor memory device

SAMSUNG ELECTRONICS CO LTD13 citations74
US6214663B1Apr 10, 2001

Methods of fabricating integrated circuit devices having contact pads which are separated by sidewall spacers

SAMSUNG ELECTRONICS CO LTD12 citations71
US7816270B2Oct 19, 2010

Method of forming minute patterns in semiconductor device using double patterning

SAMSUNG ELECTRONICS CO LTD5 citations63
US9093454B2Jul 28, 2015

Semiconductor devices having fine patterns

SAMSUNG ELECTRONICS CO LTD2 citations62
US8902660B2Dec 2, 2014

Semiconductor devices having wiring with contact pads and dummy lines

SAMSUNG ELECTRONICS CO LTD1 citations62
US7772069B2Aug 10, 2010

Methods of forming a semiconductor device

SAMSUNG ELECTRONICS CO LTD2 citations61
US7419909B2Sep 2, 2008

Methods of forming a semiconductor device that allow patterns in different regions that have different pitches to be connected

SAMSUNG ELECTRONICS CO LTD5 citations60
US7973357B2Jul 5, 2011

Non-volatile memory devices

SAMSUNG ELECTRONICS CO LTD0 citations52

MICRON TECHNOLOGY INC

16 patents
US9691452B2Jun 27, 2017

Apparatuses and methods for concurrently accessing different memory planes of a memory

MICRON TECHNOLOGY INC15 citations93
US7880531B2Feb 1, 2011

System, apparatus, and method for selectable voltage regulation

MICRON TECHNOLOGY INC21 citations93
US10083727B2Sep 25, 2018

Apparatuses and methods for concurrently accessing different memory planes of a memory

MICRON TECHNOLOGY INC7 citations84
US9870280B2Jan 16, 2018

Apparatuses and methods for comparing a current representative of a number of failing memory cells

MICRON TECHNOLOGY INC5 citations84
US9672875B2Jun 6, 2017

Methods and apparatuses for providing a program voltage responsive to a voltage determination

MICRON TECHNOLOGY INC9 citations84
US9530470B2Dec 27, 2016

Method and apparatus for pre-charging data lines in a memory cell array

MICRON TECHNOLOGY INC5 citations84
US9349420B2May 24, 2016

Apparatuses and methods for comparing a current representative of a number of failing memory cells

MICRON TECHNOLOGY INC4 citations84
US10755755B2Aug 25, 2020

Apparatuses and methods for concurrently accessing different memory planes of a memory

MICRON TECHNOLOGY INC5 citations82
US9443610B1Sep 13, 2016

Leakage current detection

MICRON TECHNOLOGY INC19 citations81
US9947375B2Apr 17, 2018

Methods and apparatuses for providing a program voltage responsive to a voltage determination

MICRON TECHNOLOGY INC2 citations73
US11462250B2Oct 4, 2022

Apparatuses and methods for concurrently accessing different memory planes of a memory

MICRON TECHNOLOGY INC1 citations71
US10127988B2Nov 13, 2018

Temperature compensation in memory sensing

MICRON TECHNOLOGY INC4 citations69
US11955204B2Apr 9, 2024

Apparatuses and methods for concurrently accessing different memory planes of a memory

MICRON TECHNOLOGY INC0 citations63
US10095574B2Oct 9, 2018

Apparatuses and methods for comparing a current representative of a number of failing memory cells

MICRON TECHNOLOGY INC1 citations63
US10366728B2Jul 30, 2019

Methods and apparatuses for providing a program voltage responsive to a voltage determination

MICRON TECHNOLOGY INC0 citations52
US10318372B2Jun 11, 2019

Apparatuses and methods for comparing a current representative of a number of failing memory cells

MICRON TECHNOLOGY INC0 citations52

PARK SANG-YONG

4 patents

PARK JANG-HO

4 patents

LEE YOUNG-HO

3 patents

HYUNDAI ELECTRONICS IND

2 patents

PARK JAE-KWAN

2 patents

INTEL CORP

1 patent

KIM HYUN-SUK

1 patent

Showing the top 50 of 55 patents by PatentIndex Score.