Inventor
NOGUCHI TAKAYA
JP20 patents
⚠️ This page may combine multiple inventors who share the name “NOGUCHI TAKAYA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MITSUBISHI ELECTRIC CORP
18 patentsUS10495668B2Dec 3, 2019
Evaluation apparatus for semiconductor device and evaluation method for semiconductor device
MITSUBISHI ELECTRIC CORP6 citations72
US9257316B2Feb 9, 2016
Semiconductor testing jig and transfer jig for the same
MITSUBISHI ELECTRIC CORP2 citations62
US10359448B2Jul 23, 2019
Device and method for inspecting position of probe, and semiconductor evaluation apparatus
MITSUBISHI ELECTRIC CORP1 citations61
US10209273B2Feb 19, 2019
Probe position inspection apparatus, semiconductor device inspection apparatus and semiconductor device inspection method
MITSUBISHI ELECTRIC CORP1 citations61
US12345739B2Jul 1, 2025
Semiconductor test apparatus and semiconductor test method
MITSUBISHI ELECTRIC CORP0 citations60
US12007414B2Jun 11, 2024
Semiconductor test apparatus and semiconductor test method
MITSUBISHI ELECTRIC CORP0 citations60
US11380596B2Jul 5, 2022
Semiconductor test apparatus, semiconductor device test method, and semiconductor device manufacturing method
MITSUBISHI ELECTRIC CORP0 citations60
US11828786B2Nov 28, 2023
Electrical characteristic inspection device for semiconductor device and electrical characteristic inspection method for semiconductor device
MITSUBISHI ELECTRIC CORP0 citations53
US11901201B2Feb 13, 2024
Semiconductor manufacturing apparatus and method of manufacturing semiconductor device
MITSUBISHI ELECTRIC CORP0 citations52
US8980655B2Mar 17, 2015
Test apparatus and test method
MITSUBISHI ELECTRIC CORP1 citations51
US9684015B2Jun 20, 2017
Measuring apparatus and measuring method utilizing insulating liquid
MITSUBISHI ELECTRIC CORP0 citations48
US10725086B2Jul 28, 2020
Evaluation apparatus of semiconductor device and method of evaluating semiconductor device using the same
MITSUBISHI ELECTRIC CORP0 citations41
US10436833B2Oct 8, 2019
Evaluation apparatus and evaluation method
MITSUBISHI ELECTRIC CORP0 citations41
US10168380B2Jan 1, 2019
Semiconductor device evaluation jig, semiconductor device evaluation apparatus, and semiconductor device evaluation method
MITSUBISHI ELECTRIC CORP0 citations41
US9678143B2Jun 13, 2017
Semiconductor evaluation apparatus
MITSUBISHI ELECTRIC CORP0 citations41
US9804197B2Oct 31, 2017
Evaluation apparatus and probe position inspection method
MITSUBISHI ELECTRIC CORP0 citations40
US9562929B2Feb 7, 2017
Measurement device
MITSUBISHI ELECTRIC CORP0 citations40
US9684027B2Jun 20, 2017
Measuring apparatus
MITSUBISHI ELECTRIC CORP0 citations34