Inventor
TAKESAKO NORIHIRO
JP10 patents
Patents
10 patentsUS9257316B2Feb 9, 2016
Semiconductor testing jig and transfer jig for the same
MITSUBISHI ELECTRIC CORP2 citations62
US10359448B2Jul 23, 2019
Device and method for inspecting position of probe, and semiconductor evaluation apparatus
MITSUBISHI ELECTRIC CORP1 citations61
US10209273B2Feb 19, 2019
Probe position inspection apparatus, semiconductor device inspection apparatus and semiconductor device inspection method
MITSUBISHI ELECTRIC CORP1 citations61
US6556880B2Apr 29, 2003
Production schedule planning device and a method of producing a semiconductor device using the same
MITSUBISHI ELECTRIC CORP3 citations53
US10068814B2Sep 4, 2018
Apparatus and method for evaluating semiconductor device comprising thermal image processing
MITSUBISHI ELECTRIC CORP1 citations51
US8980655B2Mar 17, 2015
Test apparatus and test method
MITSUBISHI ELECTRIC CORP1 citations51
US9995786B2Jun 12, 2018
Apparatus and method for evaluating semiconductor device
MITSUBISHI ELECTRIC CORP0 citations41
US9678143B2Jun 13, 2017
Semiconductor evaluation apparatus
MITSUBISHI ELECTRIC CORP0 citations41
US9804197B2Oct 31, 2017
Evaluation apparatus and probe position inspection method
MITSUBISHI ELECTRIC CORP0 citations40
US9562929B2Feb 7, 2017
Measurement device
MITSUBISHI ELECTRIC CORP0 citations40