P

Inventor

YAMASHITA KINYA

JP26 patents
⚠️ This page may combine multiple inventors who share the name “YAMASHITA KINYA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MITSUBISHI ELECTRIC CORP

13 patents
US9720014B2Aug 1, 2017

Semiconductor evaluation apparatus and semiconductor evaluation method

MITSUBISHI ELECTRIC CORP7 citations80
US12469722B2Nov 11, 2025

Semiconductor manufacturing apparatus

MITSUBISHI ELECTRIC CORP0 citations62
US9257316B2Feb 9, 2016

Semiconductor testing jig and transfer jig for the same

MITSUBISHI ELECTRIC CORP2 citations62
US10539607B2Jan 21, 2020

Evaluation apparatus including a plurality of insulating portions surrounding a probe and semiconductor device evaluation method based thereon

MITSUBISHI ELECTRIC CORP0 citations52
US10228412B2Mar 12, 2019

Semiconductor device and method for testing same

MITSUBISHI ELECTRIC CORP0 citations52
US9335371B2May 10, 2016

Semiconductor evaluating device and semiconductor evaluating method

MITSUBISHI ELECTRIC CORP0 citations52
US11624767B2Apr 11, 2023

Semiconductor test apparatus and semiconductor test method

MITSUBISHI ELECTRIC CORP0 citations51
US8980655B2Mar 17, 2015

Test apparatus and test method

MITSUBISHI ELECTRIC CORP1 citations51
US10192797B2Jan 29, 2019

Semiconductor device and electrical contact structure thereof

MITSUBISHI ELECTRIC CORP0 citations42
US9551745B2Jan 24, 2017

Semiconductor device assessment apparatus

MITSUBISHI ELECTRIC CORP0 citations42
US9117880B2Aug 25, 2015

Method for manufacturing semiconductor device

MITSUBISHI ELECTRIC CORP0 citations42
US10436833B2Oct 8, 2019

Evaluation apparatus and evaluation method

MITSUBISHI ELECTRIC CORP0 citations41
US9678143B2Jun 13, 2017

Semiconductor evaluation apparatus

MITSUBISHI ELECTRIC CORP0 citations41

KYOWA HAKKO KOGYO KK

4 patents

OKADA AKIRA

4 patents

AKIYAMA HAJIME

2 patents

KYOWA HAKKO KIRIN CO LTD

2 patents

SASAKURA ENG CO LTD

1 patent