Inventor
PROKSCH ROGER
US48 patents
⚠️ This page may combine multiple inventors who share the name “PROKSCH ROGER”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ASYLUM RESEARCH CORP
17 patentsUS7038443B2May 2, 2006
Linear variable differential transformers for high precision position measurements
ASYLUM RESEARCH CORP54 citations96
US6884981B2Apr 26, 2005
Diffractive optical position detector
ASYLUM RESEARCH CORP22 citations92
US7937991B2May 10, 2011
Fully digitally controller for cantilever-based instruments
ASYLUM RESEARCH CORP11 citations91
US8024963B2Sep 27, 2011
Material property measurements using multiple frequency atomic force microscopy
ASYLUM RESEARCH CORP11 citations82
US7685869B2Mar 30, 2010
Nanoindenter
ASYLUM RESEARCH CORP10 citations80
US8370960B2Feb 5, 2013
Modular atomic force microscope
ASYLUM RESEARCH CORP14 citations78
US7434445B2Oct 14, 2008
Apparatus for determining cantilever parameters
ASYLUM RESEARCH CORP7 citations74
US7372254B2May 13, 2008
Linear force detecting element formed without ferromagnetic materials which produces a resolution in a range of microns or less
ASYLUM RESEARCH CORP4 citations73
US7271582B2Sep 18, 2007
Linear variable differential transformers for high precision position measurements
ASYLUM RESEARCH CORP5 citations73
US7262592B2Aug 28, 2007
Linear variable differential transformers for high precision position measurements
ASYLUM RESEARCH CORP6 citations73
US7233140B2Jun 19, 2007
Position sensing assembly with sychronizing capability
ASYLUM RESEARCH CORP5 citations73
US7084384B2Aug 1, 2006
Diffractive optical position detector in an atomic force microscope having a moveable cantilever
ASYLUM RESEARCH CORP6 citations73
US7234342B2Jun 26, 2007
Fully digital controller for cantilever-based instruments
ASYLUM RESEARCH CORP8 citations72
US7066005B2Jun 27, 2006
Noncontact sensitivity and compliance calibration method for cantilever-based insturments
ASYLUM RESEARCH CORP2 citations63
US7266997B2Sep 11, 2007
Tactile force and/or position feedback for cantilever-based force measurement instruments
ASYLUM RESEARCH CORP2 citations62
US9604846B2Mar 28, 2017
Thermal measurements using multiple frequency atomic force microscopy
ASYLUM RESEARCH CORP1 citations60
US7861315B2Dec 28, 2010
Method for microfabricating a probe with integrated handle, cantilever, tip and circuit
ASYLUM RESEARCH CORP2 citations54
PROKSCH ROGER
9 patentsUS8302456B2Nov 6, 2012
Active damping of high speed scanning probe microscope components
PROKSCH ROGER15 citations92
US8925376B2Jan 6, 2015
Fully digitally controller for cantilever-based instruments
PROKSCH ROGER9 citations82
US8205488B2Jun 26, 2012
Fully digitally controller for cantilever-based instruments
PROKSCH ROGER7 citations82
US8677809B2Mar 25, 2014
Thermal measurements using multiple frequency atomic force microscopy
PROKSCH ROGER6 citations81
US8502525B2Aug 6, 2013
Integrated micro actuator and IVDT for high precision position measurements
PROKSCH ROGER9 citations81
US7459904B2Dec 2, 2008
Precision position sensor using a nonmagnetic coil form
PROKSCH ROGER7 citations73
US8555711B2Oct 15, 2013
Material property measurements using multiple frequency atomic fore microscopy
PROKSCH ROGER1 citations61
US8763475B2Jul 1, 2014
Active damping of high speed scanning probe microscope components
PROKSCH ROGER0 citations52
US9518814B2Dec 13, 2016
Integrated micro actuator and LVDT for high precision position measurements
PROKSCH ROGER0 citations49
OXFORD INSTRUMENTS ASYLUM RES INC
8 patentsUS9841436B2Dec 12, 2017
AM/FM measurements using multiple frequency of atomic force microscopy
OXFORD INSTRUMENTS ASYLUM RES INC5 citations82
US10705114B2Jul 7, 2020
Metrological scanning probe microscope
OXFORD INSTRUMENTS ASYLUM RES INC2 citations71
US10444258B2Oct 15, 2019
AM/FM measurements using multiple frequency atomic force microscopy
OXFORD INSTRUMENTS ASYLUM RES INC3 citations71
US10338096B2Jul 2, 2019
Metrological scanning probe microscope
OXFORD INSTRUMENTS ASYLUM RES INC3 citations71
USRE49997EJun 4, 2024
Metrological scanning probe microscope
OXFORD INSTRUMENTS ASYLUM RES INC0 citations61
US10054612B2Aug 21, 2018
Optical beam positioning unit for atomic force microscope
OXFORD INSTRUMENTS ASYLUM RES INC1 citations50
US10416190B2Sep 17, 2019
Modular atomic force microscope with environmental controls
OXFORD INSTRUMENTS ASYLUM RES INC0 citations49
US9921242B2Mar 20, 2018
Automated atomic force microscope and the operation thereof
OXFORD INSTRUMENTS ASYLUM RES INC1 citations43
OXFORD INSTR ASYLUM RES INC
6 patentsUS9453857B2Sep 27, 2016
AM/FM measurements using multiple frequency of atomic force microscopy
OXFORD INSTR ASYLUM RES INC6 citations82
US9383386B2Jul 5, 2016
Optical beam positioning unit for atomic force microscope
OXFORD INSTR ASYLUM RES INC7 citations82
US9581616B2Feb 28, 2017
Modular atomic force microscope with environmental controls
OXFORD INSTR ASYLUM RES INC2 citations69
US9097737B2Aug 4, 2015
Modular atomic force microscope with environmental controls
OXFORD INSTR ASYLUM RES INC3 citations59
US9804193B2Oct 31, 2017
Metrological scanning probe microscope
OXFORD INSTR ASYLUM RES INC0 citations50
US9383388B2Jul 5, 2016
Automated atomic force microscope and the operation thereof
OXFORD INSTR ASYLUM RES INC1 citations44
OXFORD INSTR PLC
3 patentsUS10215773B2Feb 26, 2019
Material property measurements using multiple frequency atomic force microscopy
OXFORD INSTR PLC1 citations63
US10107832B2Oct 23, 2018
Fully digitally controller for cantilever-based instruments
OXFORD INSTR PLC0 citations50
US9689890B2Jun 27, 2017
Fully digitally controller for cantilever-based instruments
OXFORD INSTR PLC0 citations50