Inventor

LIN XIJIANG

US20 patents

⚠️ This page may combine multiple inventors who share the name “LIN XIJIANG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

LIN XIJIANG

MENTOR GRAPHICS CORP

Low power scan testing techniques and apparatus

Timing-aware test generation and fault simulation

Timing-aware test generation and fault simulation

Test generation methods for reducing power dissipation and supply currents

Timing-aware test generation and fault simulation

Logic built-in self-test with high test coverage and low switching activity

Identification of power sensitive scan cells

Library cell modeling for transistor-level test pattern generation

Scan cell selection for partial scan designs

Deterministic test pattern generation for designs with timing exceptions

Test data volume reduction based on test cube properties

Transition test generation for detecting cell internal defects

Dynamic shift for test pattern compression

LIN XIJIANG

Scan cell use with reduced power consumption

Low power scan testing techniques and apparatus

Test generation methods for reducing power dissipation and supply currents

Timing-aware test generation and fault simulation

Timing-aware test generation and fault simulation

RAJSKI JANUSZ

At-speed scan testing with controlled switching activity

NEC USA INC

On-line partitioning for sequential circuit test generation