Inventor
ANDO ATSUSHI
JP79 patents
⚠️ This page may combine multiple inventors who share the name “ANDO ATSUSHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOSHIBA KK
14 patentsUS5989759ANov 23, 1999
Pattern forming method using alignment from latent image or base pattern on substrate
TOSHIBA KK41 citations96
US6147355ANov 14, 2000
Pattern forming method
TOSHIBA KK22 citations93
US6495841B1Dec 17, 2002
Charged beam drawing apparatus
TOSHIBA KK30 citations92
US5994030ANov 30, 1999
Pattern-forming method and lithographic system
TOSHIBA KK23 citations92
US6940080B2Sep 6, 2005
Charged particle beam lithography system, lithography method using charged particle beam, method of controlling charged particle beam, and method of manufacturing semiconductor device
TOSHIBA KK12 citations84
US6633045B1Oct 14, 2003
Assembly part with wiring and for manufacturing system, method of manufacturing such assembly part, and semiconductor manufacturing system constituted using assembly part
TOSHIBA KK13 citations84
US7102147B2Sep 5, 2006
Charged particle beam exposure method and method for producing charged particle beam exposure data
TOSHIBA KK8 citations74
US7095023B2Aug 22, 2006
Charged particle beam apparatus, charged particle detection method, and method of manufacturing semiconductor device
TOSHIBA KK8 citations74
US6941008B2Sep 6, 2005
Pattern forming method
TOSHIBA KK7 citations74
US6718532B2Apr 6, 2004
Charged particle beam exposure system using aperture mask in semiconductor manufacture
TOSHIBA KK10 citations74
US5994007ANov 30, 1999
Pattern forming method utilizing first insulative and then conductive overlayer and underlayer
TOSHIBA KK9 citations74
US6093931AJul 25, 2000
Pattern-forming method and lithographic system
TOSHIBA KK11 citations73
US5843603ADec 1, 1998
Method of evaluating shaped beam of charged beam writer and method of forming pattern
TOSHIBA KK14 citations73
US7109501B2Sep 19, 2006
Charged particle beam lithography system, pattern drawing method, and method of manufacturing semiconductor device
TOSHIBA KK6 citations63
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD
8 patentsUS5404299AApr 4, 1995
Electronic dictionary system
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD258 citations97
US7178159B1Feb 13, 2007
Information providing apparatus
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD32 citations92
US5388234AFeb 7, 1995
Finite state automation text search apparatus having two-level memory structure
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD28 citations91
US6804302B1Oct 12, 2004
Multimedia information coding apparatus, coding method of multimedia information, and recording media storing data coded by the same method
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD16 citations84
US7627647B2Dec 1, 2009
Information terminal
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD6 citations74
US7246152B2Jul 17, 2007
Information terminal
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD8 citations74
US7082165B2Jul 25, 2006
Video compression and transmission apparatus and video compression and transmission method
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD4 citations63
US6683997B1Jan 27, 2004
Apparatus and method for resolution transformation of orthogonal transformation image
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD5 citations63
NUFLARE TECHNOLOGY INC
8 patentsUS10777384B2Sep 15, 2020
Multiple beam image acquisition apparatus and multiple beam image acquisition method
NUFLARE TECHNOLOGY INC3 citations73
US10629406B2Apr 21, 2020
Optical system adjustment method of image acquisition apparatus
NUFLARE TECHNOLOGY INC3 citations73
US11145485B2Oct 12, 2021
Multiple electron beams irradiation apparatus
NUFLARE TECHNOLOGY INC6 citations72
US11139138B2Oct 5, 2021
Multiple electron beams irradiation apparatus
NUFLARE TECHNOLOGY INC5 citations72
US10734190B2Aug 4, 2020
Multiple electron beam irradiation apparatus, multiple electron beam inspection apparatus and multiple electron beam irradiation method
NUFLARE TECHNOLOGY INC3 citations72
US10840057B2Nov 17, 2020
Multiple beam inspection apparatus and sensitivity correction method for multi-detector
NUFLARE TECHNOLOGY INC1 citations63
US10215718B2Feb 26, 2019
Electron beam inspection apparatus and electron beam inspection method
NUFLARE TECHNOLOGY INC1 citations63
US12261015B2Mar 25, 2025
Electron beam inspection apparatus
NUFLARE TECHNOLOGY INC0 citations62
NIPPON TELEGRAPH & TELEPHONE
4 patentsUS11557311B2Jan 17, 2023
Satisfaction estimation model learning apparatus, satisfaction estimating apparatus, satisfaction estimation model learning method, satisfaction estimation method, and program
NIPPON TELEGRAPH & TELEPHONE2 citations71
US11521641B2Dec 6, 2022
Model learning device, estimating device, methods therefor, and program
NIPPON TELEGRAPH & TELEPHONE4 citations71
US12394406B2Aug 19, 2025
Paralinguistic information estimation model learning apparatus, paralinguistic information estimation apparatus, and program
NIPPON TELEGRAPH & TELEPHONE0 citations60
US11756554B2Sep 12, 2023
Attribute identification method, and program
NIPPON TELEGRAPH & TELEPHONE0 citations60
TAKAYAMA HISASHI
3 patentsOLYMPUS CORP
2 patentsNISSHIN STEEL CO LTD
2 patentsFUJITSU FRONTECH LTD
2 patentsMELEC CO LTD
1 patentJTEKT CORP
1 patentKOBAYASHI TSUNE
1 patentHASEGAWA HARUNARI
1 patentTOYODA MACHINE WORKS LTD
1 patentTOKYO ELECTRON LTD
1 patentAGENCY IND SCIENCE TECHN
1 patentShowing the top 50 of 79 patents by PatentIndex Score.